About: Direct mapping of theCoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy

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About: Direct mapping of theCoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy Goto Sponge NotDistinct Permalink

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scientific article published on 01 November 1994

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в листопаді 1994 (uk) article scientifique publié en 1994 (fr) im November 1994 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu en payares de 1994 (ast) scientific article published on 01 November 1994 (en)
publication date	wds:Q59820678-AF1659C0-D509-4B9E-8368-088A1313A537
publication date	1994-11-01 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q59820678-A09459D3-5D9E-4742-971A-9ACA1FB516C7
language of work or name	English
cites work	wds:Q59820678-3B4770DC-DEB2-4612-9274-FED1E620513D wds:Q59820678-4281C952-0062-42E7-9198-C0809A80F642 wds:Q59820678-44F49E35-1D87-4F9C-9BB4-FCABDE4E1A0B wds:Q59820678-81715329-FBF7-43D0-ADFE-AF25FC2D11B8 wds:Q59820678-97580E43-9665-4F63-B2D9-435C06B32A21 wds:Q59820678-BC97A920-57D4-47BC-AA01-5A644C67BC32 wds:Q59820678-C84F37F1-19B5-4385-8A81-E25A369C1386 wds:Q59820678-FD00DA1C-B04A-4816-9C3B-D900196A0351
cites work	Observation of interface band structure by ballistic-electron-emission microscopy Mapping quantum-well energy profiles of III-V heterostructures by scanning-tunneling-microscope-excited luminescence Electron transmission probability across CoSi2/n-Si(111) interfaces measured with a scanning tunneling microscope Hot Carrier Scattering at Interfacial Dislocations Observed by Ballistic-Electron-Emission Microscopy Interfacial dislocations detected by scanning tunneling microscopy Direct spectroscopy of electron and hole scattering New silicide interface model from structural energy calculations Tunneling spectroscopy and inverse photoemission: Image and field states.
author name string	wds:Q59820678-B23CDDEC-F7D3-4F90-9562-A7E367CC68E6 wds:Q59820678-D3FC1295-016D-4FD0-9E3F-C39DD9D216A2
author name string	Lee EY von Känel H
rdfs:label	Direct mapping of theCoSi2/Si (nl) Direct mapping of theCoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy (en)
skos:prefLabel	Direct mapping of theCoSi2/Si (nl) Direct mapping of theCoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy (en)
name	Direct mapping of theCoSi2/Si (nl) Direct mapping of theCoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy (en)
author	wds:Q59820678-59D3EDB5-688B-42B4-8D1C-5FE92A584968
author	Henning Sirringhaus
title	wds:Q59820678-B9C9CACA-C1D7-438E-827A-A732546FE1D4
title	Direct mapping of the CoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy (en)
page(s)	wds:Q59820678-897757E3-8E99-4098-8BA9-412D8D567BE3
page(s)	14714-14717
instance of	wds:Q59820678-0A4EA739-D862-49BC-823E-811B796809C3
instance of	scholarly article
PubMed ID	wds:Q59820678-36D04E57-AD36-430D-B340-D9FA0D9E35F2
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/9975717
PubMed ID	9975717
published in	wds:Q59820678-A37BE7D0-834E-4768-83C4-3FC7A5E8C187
published in	Physical Review B
issue	wds:Q59820678-8FE25D80-A69A-4769-83B8-05D47DA0D6CA
volume	wds:Q59820678-D6FE86A8-7EE4-4C6E-8C68-B800C8E3A97D
issue	19
volume	50
DOI	wds:Q59820678-EFA7EFF5-9C46-41C6-9CC3-3322172B24F5
DOI	http://dx.doi.org/10.1103/PHYSREVB.50.14714
DOI	10.1103/PHYSREVB.50.14714
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q59820678
is cites work of	Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111)
is cites work of	wds:Q59820657-5F97843B-E943-4EB0-9A9C-8C6E026A82F8

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