About: Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111)

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About: Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111) Goto Sponge NotDistinct Permalink

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scientific article published on 01 July 1995

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rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в липні 1995 (uk) article scientifique publié en 1995 (fr) im Juli 1995 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu en xunetu de 1995 (ast) scientific article published on 01 July 1995 (en)
publication date	wds:Q59820657-4C38E994-E43B-434F-B9A6-25D003110174
publication date	1995-07-01 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q59820657-00365BF3-7825-47DD-8252-E1D513D65E77
language of work or name	English
cites work	wds:Q59820657-05D61267-C7E8-45A8-A550-DA0647BFEFFD wds:Q59820657-07B53D18-66D3-48CF-BCF5-A9929C6F02EA wds:Q59820657-2395C83D-4228-4C3B-85E6-589645DBB5DA wds:Q59820657-2FDB514D-38F0-4971-BDA6-B17723AF6A38 wds:Q59820657-32DD9F8B-A75B-42BA-88B4-8C8636AEE7B4 wds:Q59820657-369C1583-ACBC-44A0-937A-B81A78C23EA9 wds:Q59820657-3A33262C-613B-4947-9E33-4BC305437B07 wds:Q59820657-47D9E12D-8023-4FE8-AF0E-2D579D5A3C83 wds:Q59820657-4886A48D-9A50-4BAC-851B-972A88DC3999 wds:Q59820657-55E2D38A-2635-4FA9-9EE6-8CC59C0A27A2 wds:Q59820657-5F97843B-E943-4EB0-9A9C-8C6E026A82F8 wds:Q59820657-6660390C-676F-468B-AF92-A8F175A7AA1B wds:Q59820657-787E4C12-4A09-454E-B17B-876D9EB97128 wds:Q59820657-7E298ADC-4FE9-4048-A482-5C01AFF7B16A wds:Q59820657-8102BD98-0210-4E24-A1BE-FB9EAC3AEA90 wds:Q59820657-8FAE70E1-8EC9-47D4-A9AB-AAE1AB6699E1 wds:Q59820657-968E6278-C0F7-4A10-BA15-32149ED63E54 wds:Q59820657-9C3A431F-BDB3-4FEE-92DB-F534F291B799 wds:Q59820657-B796AC03-18DA-45B4-9229-F06BA72F5086 wds:Q59820657-BEAAF710-9B69-46EB-B236-C114B34F8277 wds:Q59820657-C3C601ED-338D-4ACC-ACF7-CACA8C2AF47F wds:Q59820657-CB286628-A68B-4F42-865E-942FC1CC4182 wds:Q59820657-D68D2397-618F-4857-915C-40C1B30B2D9F wds:Q59820657-E3948BDC-5E4A-4E7F-AF50-F3F2E1B815B4 wds:Q59820657-E3B880E0-6C00-4D90-A84C-2F7948B5C786 wds:Q59820657-F336D8B5-4D1B-4EFB-9C1B-EB2164C2483B
cites work	Theory of a single-atom point source for electrons Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy Observation of interface band structure by ballistic-electron-emission microscopy Electronic structure of the Si(111)2 x 1 surface by scanning-tunneling microscopy Direct mapping of theCoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy Electron transmission probability across CoSi2/n-Si(111) interfaces measured with a scanning tunneling microscope Hot Carrier Scattering at Interfacial Dislocations Observed by Ballistic-Electron-Emission Microscopy Interfacial dislocations detected by scanning tunneling microscopy Direct spectroscopy of electron and hole scattering Theory of ballistic-electron-emission spectroscopy of NiSi2/Si(111) interfaces Quantitative study of electron transport in ballistic-electron-emission microscopy Scattering by ionization and phonon emission in semiconductors Ballistic-electron-emission microscopy and spectroscopy of GaP(110)-metal interfaces Specular boundary scattering and electrical transport in single-crystal thin films of CoSi2 Electron-hole pair creation and metal/semiconductor interface scattering observed by ballistic-electron-emission microscopy Novel transport effects in high-bias ballistic-electron-emission spectroscopy Hot electron scattering processes in metal films and at metal-semiconductor interfaces Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces Electronic structure and properties of CoSi2 Ballistic-hole spectroscopy of interfaces Probing hot-carrier transport and elastic scattering using ballistic-electron-emission microscopy Surface study of thin epitaxial CoSi2/Si(100) layers by scanning tunneling microscopy and reflection high-energy electron diffraction Electronic structure and properties of NiSi2 and CoSi2 in the fluorite and adamantane structures Observation of misfit dislocations in epitaxial CoSi2/Si (111) layers by scanning tunneling microscopy Scanning-tunneling-microscopy investigation of the quantum-size effect in epitaxial CoSi2/Si(111). Electronic structure of cobalt disilicide
author name string	wds:Q59820657-89CFFB63-ED30-4239-AAA1-E9FE9CB246D5 wds:Q59820657-D634B5E6-D53B-4262-9165-651BF37ECE79 wds:Q59820657-E4FEFC17-AC6E-42C9-8ECB-24E70F298E7F
author name string	Lee EY von Känel H Kafader U
rdfs:label	Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si (nl) Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111) (en)
skos:prefLabel	Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si (nl) Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111) (en)
name	Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si (nl) Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111) (en)
author	wds:Q59820657-10B2557A-FCA1-4507-A64D-DE36AB88E06E
author	Henning Sirringhaus
title	wds:Q59820657-1B615D10-8EC7-440E-97BA-AC447D079B95
title	Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxial CoSi2 films on Si(100) and Si(111) (en)
page(s)	wds:Q59820657-54265205-49DE-485D-B4E3-928FC5086A01
page(s)	1816-1829
instance of	wds:Q59820657-9F381BBE-00AB-4A8C-8820-65EE1B382D75
instance of	scholarly article
PubMed ID	wds:Q59820657-608AC361-0389-46B8-96D1-8CD72081E7A8
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/9981249
PubMed ID	9981249
published in	wds:Q59820657-855646BD-B69B-4B61-83E5-1DB02E6B3F9A
published in	Physical Review B
issue	wds:Q59820657-AA914837-8F77-404A-A349-33E830AEF7C5
volume	wds:Q59820657-F14FF1A3-993B-4B44-A0D8-353CE27071B8
issue	3
volume	52
DOI	wds:Q59820657-3115359E-D8D3-40EB-B372-EC78BF26FE8C
DOI	http://dx.doi.org/10.1103/PHYSREVB.52.1816
DOI	10.1103/PHYSREVB.52.1816
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q59820657

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