<http://www.wikidata.org/entity/statement/Q81376701-E9A895E9-8B35-44B4-B689-5E402F7F4C81>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://www.wikidata.org/reference/07221f375b1b2e2fd05dbc130cbefd8a8bfb2600> .
<http://www.wikidata.org/entity/statement/Q81376701-E9A895E9-8B35-44B4-B689-5E402F7F4C81>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://wikiba.se/ontology#BestRank> .
<http://www.wikidata.org/entity/statement/Q81376701-E9A895E9-8B35-44B4-B689-5E402F7F4C81>	<http://wikiba.se/ontology#rank>	<http://wikiba.se/ontology#NormalRank> .
<http://www.wikidata.org/entity/statement/Q81376701-E9A895E9-8B35-44B4-B689-5E402F7F4C81>	<http://www.wikidata.org/prop/statement/P1476>	"Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy"@en .
<http://www.wikidata.org/entity/statement/Q81376701-E9A895E9-8B35-44B4-B689-5E402F7F4C81>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://wikiba.se/ontology#Statement> .