<http://www.wikidata.org/entity/Q60244368>	<http://www.w3.org/2000/01/rdf-schema#label>	"Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy"@nl .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P356>	"10.1016/J.MSEA.2003.08.092" .
<http://www.wikidata.org/entity/Q60244368>	<http://www.w3.org/2004/02/skos/core#prefLabel>	"Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy"@en .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P478>	"370" .
<http://www.wikidata.org/entity/Q60244368>	<http://www.w3.org/2004/02/skos/core#prefLabel>	"Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy"@nl .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P1433>	<http://www.wikidata.org/entity/Q15764448> .
<http://www.wikidata.org/entity/Q60244368>	<http://schema.org/name>	"Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy"@en .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P2093>	"R. Cantelli" .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P433>	"1-2" .
<http://www.wikidata.org/entity/Q60244368>	<http://schema.org/name>	"Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy"@nl .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P31>	<http://www.wikidata.org/entity/Q13442814> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P50>	<http://www.wikidata.org/entity/Q57983134> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P921>	<http://www.wikidata.org/entity/Q11456> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P304>	<http://www.wikidata.org/entity/statement/Q60244368-2829A94D-A711-48E7-9430-912A6FB424E0> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P1476>	"Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy"@en .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P50>	<http://www.wikidata.org/entity/Q59925769> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P2093>	<http://www.wikidata.org/entity/statement/Q60244368-72A8A734-D5AA-4C56-BF22-666F25B6AF8D> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P31>	<http://www.wikidata.org/entity/statement/Q60244368-8405660D-57F0-4D7B-B5BE-024FE3709D03> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://wikiba.se/ontology#Item> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P577>	"2004-04-01T00:00:00Z"^^<http://www.w3.org/2001/XMLSchema#dateTime> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct/P304>	"114-117" .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P577>	<http://www.wikidata.org/entity/statement/Q60244368-D902C9F2-13B3-4AC7-990A-3521A18AB0E0> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P433>	<http://www.wikidata.org/entity/statement/Q60244368-8872FD3F-FC7E-4776-8722-4EFAD98B4C02> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P356>	<http://www.wikidata.org/entity/statement/Q60244368-A41460DF-B682-4261-B5C6-245DE13E4855> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P50>	<http://www.wikidata.org/entity/statement/Q60244368-2B18ACBE-1367-43E4-B833-BC8DD61E92FF> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P478>	<http://www.wikidata.org/entity/statement/Q60244368-D84FFA33-CDF3-430B-925E-87A63F1930C6> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P921>	<http://www.wikidata.org/entity/statement/Q60244368-F1531A9E-4649-47FD-9935-F281FDB50F3D> .
<http://www.wikidata.org/entity/Q60244368>	<http://schema.org/description>	"im April 2004 ver\u00F6ffentlichter wissenschaftlicher Artikel"@de .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P1476>	<http://www.wikidata.org/entity/statement/Q60244368-F7DFDFA6-A363-4C75-8E14-8197AFFA0A2B> .
<http://www.wikidata.org/entity/Q60244368>	<http://schema.org/description>	"wetenschappelijk artikel"@nl .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P50>	<http://www.wikidata.org/entity/statement/Q60244368-9086C7A7-7725-4FE6-B5AF-4A4B4629CEB1> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/P1433>	<http://www.wikidata.org/entity/statement/Q60244368-D540581D-0B02-4B06-81BB-B0F6B84F1B3D> .
<http://www.wikidata.org/entity/Q60244368>	<http://www.wikidata.org/prop/direct-normalized/P356>	<http://dx.doi.org/10.1016/J.MSEA.2003.08.092> .
<http://www.wikidata.org/entity/Q60244368>	<http://schema.org/description>	"\u043D\u0430\u0443\u043A\u043E\u0432\u0430 \u0441\u0442\u0430\u0442\u0442\u044F, \u043E\u043F\u0443\u0431\u043B\u0456\u043A\u043E\u0432\u0430\u043D\u0430 \u0443 \u043A\u0432\u0456\u0442\u043D\u0456 2004"@uk .
<http://www.wikidata.org/entity/Q60244368>	<http://www.w3.org/2000/01/rdf-schema#label>	"Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy"@en .