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Namespace Prefixes

PrefixIRI
wdthttp://www.wikidata.org/prop/direct/
wdtnhttp://www.wikidata.org/prop/direct-normalized/
n12http://dx.doi.org/10.1103/
schemahttp://schema.org/
rdfshttp://www.w3.org/2000/01/rdf-schema#
skoshttp://www.w3.org/2004/02/skos/core#
wikibasehttp://wikiba.se/ontology#
phttp://www.wikidata.org/prop/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n11http://rdf.ncbi.nlm.nih.gov/pubchem/reference/
xsdhhttp://www.w3.org/2001/XMLSchema#
wdshttp://www.wikidata.org/entity/statement/
wdhttp://www.wikidata.org/entity/

Statements

Subject Item
wd:Q74496133
rdf:type
wikibase:Item
schema:description
artikull shkencor i botuar më 01 janar 1989 artículu científicu espublizáu en xineru de 1989 im Januar 1989 veröffentlichter wissenschaftlicher Artikel wetenschappelijk artikel наукова стаття, опублікована в січні 1989 scientific article published on 01 January 1989 article scientifique publié en 1989
p:P577
wds:Q74496133-49BA2512-644A-426E-A963-305F0204D489
wdt:P577
1989-01-01T00:00:00Z
p:P407
wds:Q74496133-039A04C1-E093-4229-8961-6ED17B7BD91D
wdt:P407
wd:Q1860
p:P2860
wds:Q74496133-8098EECB-7494-4702-9D2F-0B771B7C0969 wds:Q74496133-DD22EB27-C3BB-4025-8DE4-398FB7EC2F25
wdt:P2860
wd:Q54393868 wd:Q77988765
p:P2093
wds:Q74496133-B4C5B651-5B2E-4E89-91FD-8FEC9D467A05 wds:Q74496133-29E7D45F-DD34-4FDC-9EC4-DB462026A5A9 wds:Q74496133-7A38A390-2F7B-4B77-A20A-0BD3C13CAC43 wds:Q74496133-620429A0-6798-441D-B74F-F21FD6D97063 wds:Q74496133-4C583E5B-6943-48E4-B134-4FA4803A720E
wdt:P2093
Huang H Wei CM Tonner BP Li H Tong SY
rdfs:label
Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111) Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111) Quantitative structural determination of metallic film growth on a semiconductor crystal:
skos:prefLabel
Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111) Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111) Quantitative structural determination of metallic film growth on a semiconductor crystal:
schema:name
Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111) Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111) Quantitative structural determination of metallic film growth on a semiconductor crystal:
p:P50
wds:Q74496133-9B22E9BE-5175-4983-AEB8-9841F0BD482D
wdt:P50
wd:Q90045973
p:P1476
wds:Q74496133-770A8768-FB55-4182-99BB-CFA0D4F9F59F
wdt:P1476
Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)
p:P304
wds:Q74496133-A2870AB5-6E7A-41BC-BE88-BDDA2B0C0357
wdt:P304
559-562
p:P31
wds:Q74496133-54A3E4D2-1617-46FA-B9F2-1DB152821F18
wdt:P31
wd:Q13442814
p:P698
wds:Q74496133-59F2511F-3CE4-4FE4-AB43-D8CA5C498687
wdtn:P698
n11:10040266
wdt:P698
10040266
p:P1433
wds:Q74496133-31BB0905-950A-4052-878A-379F611C3B45
wdt:P1433
wd:Q2018386
p:P433
wds:Q74496133-5AC25615-8DB0-4426-8149-49483D5D1371
p:P478
wds:Q74496133-8E7DF018-B0F6-4756-9F57-5F8B71BA599F
wdt:P433
5
wdt:P478
62
p:P356
wds:Q74496133-E57A3AB5-7421-47B7-860D-AAFB55325D81
wdtn:P356
n12:PHYSREVLETT.62.559
wdt:P356
10.1103/PHYSREVLETT.62.559