This HTML5 document contains 43 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
wdthttp://www.wikidata.org/prop/direct/
wdtnhttp://www.wikidata.org/prop/direct-normalized/
n10http://dx.doi.org/10.1016/
schemahttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
rdfshttp://www.w3.org/2000/01/rdf-schema#
phttp://www.wikidata.org/prop/
wikibasehttp://wikiba.se/ontology#
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
xsdhhttp://www.w3.org/2001/XMLSchema#
wdshttp://www.wikidata.org/entity/statement/
wdhttp://www.wikidata.org/entity/

Statements

Subject Item
wd:Q62796727
rdf:type
wikibase:Item
schema:description
wetenschappelijk artikel наукова стаття, опублікована в березні 2003 article scientifique publié en 2003
p:P577
wds:Q62796727-D77744C7-FF53-46E8-97E0-11BF11CEC5FD
wdt:P577
2003-03-01T00:00:00Z
p:P2860
wds:Q62796727-2DC76DE0-BE2E-42E3-AE40-0DEC6AD8674F wds:Q62796727-76B0A9E5-198E-453B-9142-17DBF2105C3D wds:Q62796727-A0FED9D1-3B6A-44E8-AD7D-B0478FF0DBEF
wdt:P2860
wd:Q58642657 wd:Q78224495 wd:Q78159162
p:P2093
wds:Q62796727-6E594EAC-85C2-421E-920D-3308CED0B088 wds:Q62796727-3F5B9717-4797-4923-9E2F-8F3A83D326E4 wds:Q62796727-1796D227-21A1-42DC-8051-E4DC7AA69DDD wds:Q62796727-C0E8538D-7DDB-4A45-8271-DBD93E36149B
wdt:P2093
M. Szymonski P. Piatkowski B. Such J. Kolodziej
rdfs:label
Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy
skos:prefLabel
Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy
schema:name
Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy
p:P50
wds:Q62796727-66260F7C-293E-4B35-8FB9-40B3ACA8BDA7
wdt:P50
wd:Q57570486
p:P1476
wds:Q62796727-2BCBA412-8CC0-474D-AB9C-1E59E31852BA
wdt:P1476
Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy
p:P304
wds:Q62796727-E935251F-3357-4AC4-B240-7C58ACDF92F4
wdt:P304
112-116
p:P31
wds:Q62796727-EEB518B4-DA78-46CE-B970-AB066DFC9921
wdt:P31
wd:Q13442814
p:P1433
wds:Q62796727-C92184C0-92B3-4531-AAF9-9C3E11C49180
wdt:P1433
wd:Q2772524
p:P433
wds:Q62796727-7904612A-5B24-4BCB-A07A-ECB3FE35E9ED
p:P478
wds:Q62796727-412F110C-54EB-4722-921A-F089D74F8627
wdt:P433
1-2
wdt:P478
210
p:P356
wds:Q62796727-DAE4260B-E397-4866-8EAC-6B2E2523EEE9
wdtn:P356
n10:S0169-4332(02)01489-7
wdt:P356
10.1016/S0169-4332(02)01489-7