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wetenschappelijk artikel article im Januar 2008 veröffentlichter wissenschaftlicher Artikel наукова стаття, опублікована в січні 2008 article scientifique publié en 2008
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2008-01-14T00:00:00Z
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Tim Richards
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Bias-stress induced contact and channel degradation in staggered and coplanar organic field-effect transistors Bias-stress induced contact and channel degradation in staggered and coplanar organic field-effect transistors
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Bias-stress induced contact and channel degradation in staggered and coplanar organic field-effect transistors Bias-stress induced contact and channel degradation in staggered and coplanar organic field-effect transistors
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Bias-stress induced contact and channel degradation in staggered and coplanar organic field-effect transistors Bias-stress induced contact and channel degradation in staggered and coplanar organic field-effect transistors
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Bias-stress induced contact and channel degradation in staggered and coplanar organic field-effect transistors
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10.1063/1.2825584