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wd:Q58810023
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wetenschappelijk artikel article scientifique publié en 2005 im Dezember 2005 veröffentlichter wissenschaftlicher Artikel наукова стаття, опублікована в грудні 2005
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2005-12-01T00:00:00Z
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M. Volmer M. Tolan A. Hohl S. Streit J.A. Soininen
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X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
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X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
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X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
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X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
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2277-2280
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n11:J.JPCS.2005.09.050
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10.1016/J.JPCS.2005.09.050