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articol științific vědecký článek naučni članak wissenschaftlicher Artikel scienca artikolo bilimsel makale wetenschappelijk artikel 2005年学术文章 bài báo khoa học artigo científico 2005年の論文 2005年學術文章 научни чланак article scientific 2005년 논문 наукова стаття, опублікована у вересні 2005 2005年学术文章 সেপ্টেম্বর ২০০৫-এ প্রকাশিত বৈজ্ঞানিক নিবন্ধ tudományos cikk vetenskaplig artikel scientific article published in September 2005 artigo científico מאמר מדעי artikull shkencor scientific article published in September 2005 επιστημονικό άρθρο artículo científico publicado en 2005 2005年学术文章 artykuł naukowy სამეცნიერო სტატია article scientifique artigo científico 2005年學術文章 2005年学术文章 artículu científicu мақолаи илмӣ articolo scientifico научна статия vitenskapelig artikkel tieteellinen artikkeli 2005 nî lūn-bûn 2005年學術文章 teaduslik artikkel 2005年学术文章 artikulong pang-agham บทความทางวิทยาศาสตร์ scientific article published in September 2005 2005年學術文章 vedecký článok 2005年学术文章 vitskapeleg artikkel videnskabelig artikel مقالة علمية نشرت في سبتمبر 2005 научни чланак artikel ilmiah 2005年學術文章 article científic научная статья
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Jeremy M Beebe Vincent B Engelkes
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Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy. Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy.
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Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy. Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy.
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Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy. Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy.
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Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy.
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