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article scientifique publié en 2011
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2011-10-01T00:00:00Z
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W. Bała S. Dümecke M. Drozdowski
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Temperature and orientation study of cobalt phthalocyanine CoPc thin films deposited on silicon substrate as studied by micro-Raman scattering spectroscopy
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Temperature and orientation study of cobalt phthalocyanine CoPc thin films deposited on silicon substrate as studied by micro-Raman scattering spectroscopy
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Temperature and orientation study of cobalt phthalocyanine CoPc thin films deposited on silicon substrate as studied by micro-Raman scattering spectroscopy
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Temperature and orientation study of cobalt phthalocyanine CoPc thin films deposited on silicon substrate as studied by micro-Raman scattering spectroscopy
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n8:J.TSF.2011.07.051
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10.1016/J.TSF.2011.07.051