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scientific article published on 01 February 1999

AttributesValues
rdf:type
description
  • wetenschappelijk artikel (nl)
  • наукова стаття, опублікована в лютому 1999 (uk)
  • im Februar 1999 veröffentlichter wissenschaftlicher Artikel (de)
  • artículu científicu espublizáu en febreru de 1999 (ast)
  • artikull shkencor i botuar më 01 shkurt 1999 (sq)
  • scientific article published on 01 February 1999 (en)
publication date
publication date
language of work or name
language of work or name
cites work
cites work
author name string
author name string
  • C H McCollough
  • K J Ryan
  • K M Kanal
  • N Lannutti
rdfs:label
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (en)
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (nl)
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (sq)
skos:prefLabel
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (en)
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (nl)
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (sq)
name
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (en)
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (nl)
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (sq)
title
title
  • Experimental determination of section sensitivity profiles and image noise in electron beam computed tomography (en)
page(s)
page(s)
  • 287-295
instance of
instance of
main subject
main subject
PubMed ID
PubMed ID
PubMed ID
  • 10076987
published in
published in
issue
volume
issue
  • 2
volume
  • 26
DOI
DOI
DOI
  • 10.1118/1.598515
is about of
is cites work of
is cites work of
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