About: Influence of surface reconstruction on the orientation of homoepitaxial silicon films

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About: Influence of surface reconstruction on the orientation of homoepitaxial silicon films Goto Sponge NotDistinct Permalink

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scientific article published on 01 August 1990

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в серпні 1990 (uk) article scientifique publié en 1990 (fr) im August 1990 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu n'agostu de 1990 (ast) scientific article published on 01 August 1990 (en)
publication date	wds:Q74506181-947D06A0-A5C7-4739-A0CC-7845BCAFED15
publication date	1990-08-01 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q74506181-45ABC70B-4DB6-4E45-9BBB-6EB716C549C2
language of work or name	English
cites work	wds:Q74506181-0C8519F2-2A74-41E7-B9CD-8BADC7D82E0B wds:Q74506181-345B7126-03E0-4769-8C13-0CD855A83A0B wds:Q74506181-6ED0B32F-BE68-45BC-B460-550611B83BAA wds:Q74506181-7B65AC6A-C27F-4DEF-859F-B5046A2445A5 wds:Q74506181-9EBBFAB5-FAB7-4FD1-A83B-842D7E8C937D wds:Q74506181-CF15DBC9-EDD7-4086-A0ED-8789B888FDF1
cites work	Crystal truncation rods and surface roughness Surface doping and stabilization of Si(111) with boron. Structure determination of the Si(111):B( sqrt 3 x sqrt 3)R30 degrees surface: Subsurface substitutional doping Adsorption of boron on Si(111): Its effect on surface electronic states and reconstruction Ordering atSi(111)a−Siand Si(111)/SiO2Interfaces Topography of the Si(111) surface during silicon molecular-beam epitaxy
author name string	wds:Q74506181-1DC83822-2A4D-4EAD-B8CD-A72205F88A0E wds:Q74506181-BF9E02C5-C946-4597-BC53-BE3B6438FC65 wds:Q74506181-C86F8452-8CCF-485F-8ECE-8A68512BB6E2 wds:Q74506181-EB20035A-33F7-40D0-8E39-4D0849C08729 wds:Q74506181-ECCB9862-B530-4311-865C-41D17C4DC3CB
author name string	Eaglesham DJ Weir BE Bevk J Freer BS Headrick RL
rdfs:label	Influence of surface reconstruction on the orientation of homoepitaxial silicon films (en) Influence of surface reconstruction on the orientation of homoepitaxial silicon films (nl)
skos:prefLabel	Influence of surface reconstruction on the orientation of homoepitaxial silicon films (en) Influence of surface reconstruction on the orientation of homoepitaxial silicon films (nl)
name	Influence of surface reconstruction on the orientation of homoepitaxial silicon films (en) Influence of surface reconstruction on the orientation of homoepitaxial silicon films (nl)
author	wds:Q74506181-D958B45A-1D05-4544-B3DB-4CFA8C438A74
author	Leonard Feldman
title	wds:Q74506181-8DF93FDA-D623-4FFD-AE5A-7017A5C916F5
title	Influence of surface reconstruction on the orientation of homoepitaxial silicon films (en)
page(s)	wds:Q74506181-874F3622-892E-4FC1-B095-C635495D3D54
page(s)	1128-1131
instance of	wds:Q74506181-DDA5003C-5DF2-45C7-BC45-F7F9F5941EE0
instance of	scholarly article
PubMed ID	wds:Q74506181-185B4F5E-18DE-45DE-86A6-D7B6CB3798A7
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/10043112
PubMed ID	10043112
published in	wds:Q74506181-009CD860-769B-45A7-BCA1-39DF656741FA
published in	Physical Review Letters
issue	wds:Q74506181-09706FFC-8223-4D22-A368-D92A3CC34B69
volume	wds:Q74506181-0F1063DF-DEDB-4E80-870E-0D3F4CD880BF
issue	9
volume	65
DOI	wds:Q74506181-76BBD310-2861-43C7-B73A-8D922FA3AB35
DOI	http://dx.doi.org/10.1103/PHYSREVLETT.65.1128
DOI	10.1103/PHYSREVLETT.65.1128
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q74506181
is cites work of	Optical properties of twinning superlattices in diamond-type and zinc-blende-type semiconductors Direct optical transitions in indirect semiconductors: The case of Ge twinning superlattices Growth and structural analysis of an ordered boron monolayer in Si(100) Electronic properties of (111) twin boundaries and twinning superlattices in lead sulfide
is cites work of	wds:Q78138643-911EF83A-3CA1-4D81-ADED-3B30F514B8DD wds:Q74366756-B02108B0-DDFD-4FFB-8325-7E4340E916CD wds:Q78140784-CECC6DD5-8558-4FD7-89C2-C2E7E77875FD wds:Q78138471-49E75D2F-9B5E-4C06-BE6C-0428621B5536

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