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Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
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scientific article published on 01 January 1990
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description
wetenschappelijk artikel
(nl)
bài báo khoa học
(vi)
наукова стаття, опублікована в січні 1990
(uk)
im Januar 1990 veröffentlichter wissenschaftlicher Artikel
(de)
artículu científicu espublizáu en xineru de 1990
(ast)
artikull shkencor i botuar më 01 janar 1990
(sq)
scientific article published on 01 January 1990
(en)
publication date
wds:Q74502183-FD5BB99C-D964-4EE8-A5A9-1C4076B39710
publication date
1990-01-01 00:00:00Z
(
xsd:dateTime
)
language of work or name
wds:Q74502183-6242A369-E816-4C6C-B63B-73391FA3A523
language of work or name
English
cites work
wds:Q74502183-1ADDAA95-DDF3-4061-A5E8-4506570742D9
wds:Q74502183-59549B2F-65ED-48F0-9F88-D3B9445C65E5
wds:Q74502183-A189226C-DCC2-4539-B23C-AEA82F8B7A2A
wds:Q74502183-BD2E9EBA-75A8-4E7A-8131-DA3A628AD9E7
wds:Q74502183-CF924D23-424B-4D07-B752-74D34C4B41B4
cites work
Interspecimen Comparison of the Refractive Index of Fused Silica*,†
Indirect band gap of coherently strained GexSi1-x bulk alloys on <001> silicon substrates
Interband transitions of thin-layer GaAs/AlAs superlattices
New optical structure near the E transitions of InSb/InAlSb quantum wells
Localized electronic states and resonant Raman scattering from localized and quasiresonant phonons in Si-Ge layers
author name string
wds:Q74502183-59DE4A4A-F2ED-4439-AF3E-F38546A81799
wds:Q74502183-6D790868-A34C-4CF5-8B3D-5CDA7AE718D2
wds:Q74502183-741BC2C7-59BD-4B6B-BD06-0E7BDCF3B5B8
wds:Q74502183-F7A5CE78-8456-4E02-8540-EEC308387256
author name string
LeGoues FK
Iyer SS
Freeouf JL
Tsang JC
rdfs:label
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(en)
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(nl)
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(sq)
skos:prefLabel
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(en)
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(nl)
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(sq)
name
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(en)
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(nl)
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(sq)
title
wds:Q74502183-52027AA7-69B9-46E8-B21F-550B786429F9
title
Spectroscopic ellipsometry of E1-like transitions in nanometer-thickness Ge layers
(en)
page(s)
wds:Q74502183-9CB11F48-BE2E-4C94-98B6-FB5EC7A29120
page(s)
315-318
instance of
wds:Q74502183-D9F547DB-682B-4ECB-B19A-8B837EAA8372
instance of
scholarly article
PubMed ID
wds:Q74502183-08980983-A79E-42CD-A8F5-CD15349C5012
PubMed ID
http://rdf.ncbi.nlm.nih.gov/pubchem/reference/10041949
PubMed ID
10041949
published in
wds:Q74502183-64262C23-3E53-4E6C-B053-24B58CB119FC
published in
Physical Review Letters
issue
wds:Q74502183-3950BA8D-F5C3-496C-A348-0C8F8B671CCE
volume
wds:Q74502183-9B0A91E0-279E-45EB-830F-E01DF8D804AD
issue
3
volume
64
DOI
wds:Q74502183-91ABF0D2-CC30-4A59-9EF4-5455E624D938
DOI
http://dx.doi.org/10.1103/PHYSREVLETT.64.315
DOI
10.1103/PHYSREVLETT.64.315
is
about
of
https://www.wikidata.org/wiki/Special:EntityData/Q74502183
is
cites work
of
Localized and nonlocalized states in thin Ge layers grown by molecular-beam epitaxy at low temperatures
Ge-like and Si-like features in the dielectric function of strained Si/Ge superlattices
Raman spectroscopy of long-range order in epitaxial Si0.5Ge0.5 alloys
is
cites work
of
wds:Q74363283-B4A7D08C-6624-4869-9C89-B148545C20CD
wds:Q78221648-DB6C9823-DF36-4E05-83A1-28D70E165488
wds:Q74362730-737B8471-37D0-4203-843D-4719E645D903
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