About: Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements

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About: Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements Goto Sponge NotDistinct Permalink

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scholarly article by Martin Magnuson et al published 22 May 2012 in Physical Review B

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) article scientifique publié en 2012 (fr) наукова стаття, опублікована в травні 2012 (uk) im Mai 2012 veröffentlichter wissenschaftlicher Artikel (de) scholarly article by Martin Magnuson et al published 22 May 2012 in Physical Review B (en)
publication date	wds:Q63468000-B676DDE8-87DA-4492-87D4-19814BF901B0
publication date	2012-05-22 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q63468000-5BAB64B2-CB52-4180-99CB-E7DE5435149D
language of work or name	English
author name string	wds:Q63468000-A10F69C0-6956-4DC4-9DBE-875234D0BAE4 wds:Q63468000-A879CA1E-F552-469D-9AAD-0F54BFC2C80E
author name string	Lars Hultman Maurizio Mattesini
rdfs:label	Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements (en) Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements (nl)
skos:prefLabel	Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements (en) Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements (nl)
name	Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements (en) Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements (nl)
author	wds:Q63468000-48581E1E-06D1-43D5-9DE9-DD881CEFF7B7 wds:Q63468000-81E674F3-BAB5-4516-B68C-927052FE4AEA wds:Q63468000-F201FC56-157E-427A-9FFF-8BA4C3B6A494
author	Per Eklund Ngo Van Nong Martin Magnuson
title	wds:Q63468000-5F03437B-ABBD-4AC9-B5C6-22A09F56BC06
title	Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2determined by polarized x-ray spectroscopy and Seebeck measurements (en)
instance of	wds:Q63468000-20E844E2-F2D9-407F-900D-6122692687CB
instance of	scholarly article
main subject	wds:Q63468000-625FAE11-707F-4834-BEC7-23A9A20BDE8A wds:Q63468000-ED030950-48EB-4DFD-91AF-993483462278
main subject	X-ray spectroscopy condensed matter physics
published in	wds:Q63468000-BFD5039C-B489-4672-B67A-2E02239A6A60
published in	Physical Review B
issue	wds:Q63468000-1E63CF08-B15C-401F-B2F6-8EEB1DDB61B8
volume	wds:Q63468000-F84DBB14-DC24-41BD-AB12-85F87DDC5025
issue	19
volume	85
DOI	wds:Q63468000-6A7883FB-0541-418F-98D7-4A176961D1F9
DOI	http://dx.doi.org/10.1103/PHYSREVB.85.195134
DOI	10.1103/PHYSREVB.85.195134
arXiv ID	wds:Q63468000-49973907-89F5-4B3F-B151-DE07EF5775D8
arXiv ID	1205.4993
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q63468000
is cites work of	Chemical bonding and electronic-structure in MAX phases as viewed by X-ray spectroscopy and density functional theory
is cites work of	wds:Q63468285-83BBA9FB-6111-49A7-8B88-5F16BDEEB303

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