About: In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility     Goto   Sponge   NotDistinct   Permalink

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rdf:type
description
  • wetenschappelijk artikel (nl)
  • наукова стаття, опублікована в листопаді 1999 (uk)
  • article scientifique publié en 1999 (fr)
  • im November 1999 veröffentlichter wissenschaftlicher Artikel (de)
publication date
publication date
cites work
cites work
author name string
author name string
  • V.H. Etgens
  • M.C. Martins Alves
  • A. Tadjeddine
rdfs:label
  • In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility (en)
  • In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility (nl)
skos:prefLabel
  • In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility (en)
  • In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility (nl)
name
  • In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility (en)
  • In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility (nl)
title
title
  • In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility (en)
page(s)
page(s)
  • 591-599
instance of
instance of
main subject
main subject
published in
published in
issue
volume
issue
  • 4-5
volume
  • 45
DOI
DOI
DOI
  • 10.1016/S0013-4686(99)00237-6
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