About: Identification of surface anion antisite defects in (110) surfaces of III

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Identification of surface anion antisite defects in (110) surfaces of III–V semiconductors Goto Sponge NotDistinct Permalink

An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

article published in 2001

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в жовтні 2001 (uk) article scientifique publié en 2001 (fr) im Oktober 2001 veröffentlichter wissenschaftlicher Artikel (de) article published in 2001 (en) հոդված հրատարակված 2001 թվականին (hy)
publication date	wds:Q62571802-2B92E6AE-17FD-4AF5-A1F1-D5C48CA08A47
publication date	2001-10-29 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q62571802-10A7BE44-C35D-4C40-84C2-7768D19760E0
language of work or name	English
cites work	wds:Q62571802-07793BAF-5D2E-4A35-A6D1-FD1897DD5624 wds:Q62571802-0EAB5B2A-7EFB-4407-9DDA-BB6C0FD594FF wds:Q62571802-159C2C99-78A5-4919-88ED-BB90BB128096 wds:Q62571802-3B386293-C8A8-441C-A1FB-F518DCBD77CD wds:Q62571802-4D019541-39CC-4991-B055-59629C22955D wds:Q62571802-5162E9AE-0B60-4683-8A08-7C7D1A55BD63 wds:Q62571802-7C9B6AA4-D925-4D8C-92F5-2242C6A8ECCD wds:Q62571802-A352D220-B39F-4988-8D48-14F094ACF196 wds:Q62571802-CF8FBEA1-B583-404F-B987-6F3863E00364 wds:Q62571802-D20C1796-E4D2-4575-8EC5-3191DCC80B8F wds:Q62571802-D949B7E4-9BDA-4B55-8615-ACDC5D267762
cites work	Theory of Scanning Tunneling Microscopy Chemical potential dependence of defect formation energies in GaAs: Application to Ga self-diffusion Observation of bulk defects by scanning tunneling microscopy and spectroscopy: Arsenic antisite defects in GaAs Electronic structure, total energies, and abundances of the elementary point defedts in GaAs Isolated arsenic-antisite defect in GaAs and the properties of EL2 Atom-selective imaging of the GaAs(110) surface Contribution of Surface Resonances to Scanning Tunneling Microscopy Images: (110) Surfaces of III-V Semiconductors Nano-scale properties of defects in compound semiconductor surfaces Local state density and long-range screening of adsorbed oxygen atoms on the GaAs(110) surface Symmetric Versus Nonsymmetric Structure of the Phosphorus Vacancy on InP(110) Signatures of Bulk and Surface Arsenic Antisite Defects in GaAs(110)
author name string	wds:Q62571802-3D6F8C99-AB76-42CE-BBD6-870CC7F6DA19 wds:Q62571802-54927442-EB97-4599-9077-475D7B0C92BD wds:Q62571802-65E8EB1A-043D-4D82-9A44-00CEE3D10099 wds:Q62571802-6FD44F40-7892-492B-8E64-6136D0DD931A wds:Q62571802-D6F2A817-EBA2-4F00-B358-78DD91678065 wds:Q62571802-DBC9C24A-71C9-484A-94A3-93775AD48B12 wds:Q62571802-FF54967B-4B6E-4C6A-9938-813AB7B06A1D
author name string	G. Schwarz K. Horn M. Scheffler K. Urban J. Neugebauer B. Henninger P. Quadbeck
rdfs:label	Identification of surface anion antisite defects in (nl) Identification of surface anion antisite defects in (110) surfaces of III–V semiconductors (en)
skos:prefLabel	Identification of surface anion antisite defects in (nl) Identification of surface anion antisite defects in (110) surfaces of III–V semiconductors (en)
name	Identification of surface anion antisite defects in (nl) Identification of surface anion antisite defects in (110) surfaces of III–V semiconductors (en)
author	wds:Q62571802-8EA2AFB9-5EBC-4BF4-9A52-1C04599A3896
author	Philipp Ebert
title	wds:Q62571802-0CD7BBFE-4810-4F0A-8C1D-16F1696480D1
title	Identification of surface anion antisite defects in (110) surfaces of III–V semiconductors (en)
page(s)	wds:Q62571802-9EF8EF6F-1105-4F76-BE83-8631FA5D6604
page(s)	2877-2879
instance of	wds:Q62571802-4C3B61D2-5C74-4533-9C59-756DAA8F2EB1
instance of	scholarly article
main subject	wds:Q62571802-F75CFE34-792D-414C-AFF7-4DF4304DB75A
main subject	semiconductor
published in	wds:Q62571802-89FE18E2-83F4-4406-9B17-A9ADE4C73A49
published in	Applied Physics Letters
issue	wds:Q62571802-80175410-3916-4493-B450-81329EE7F870
volume	wds:Q62571802-EA83AE06-2477-43D8-A097-04C5D9D9B041
issue	18
volume	79
DOI	wds:Q62571802-65FCA5B8-987A-4E57-80E6-4A9078D110F5
DOI	http://dx.doi.org/10.1063/1.1408906
DOI	10.1063/1.1408906
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q62571802
is cites work of	Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function
is cites work of	wds:Q57739422-046C93C3-7530-42A6-84E6-D66FAF406E85

Faceted Search & Find service v1.16.117 as of May 05 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3239 as of May 5 2024, on Linux (x86_64-centos_6-linux-gnu), Single-Server Edition (378 GB total memory, 196 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software