About: Use of quantitative convergent-beam electron diffraction in materials science

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scholarly article by Randi Holmestad et al published 15 July 1999 in Microscopy Research and Technique

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в липні 1999 (uk) article scientifique publié en 1999 (fr) im Juli 1999 veröffentlichter wissenschaftlicher Artikel (de) scholarly article by Randi Holmestad et al published 15 July 1999 in Microscopy Research and Technique (en)
publication date	wds:Q60487769-67C56797-250F-4077-ACFF-3C6AD9148F13
publication date	1999-07-15 00:00:00Z (xsd:dateTime)
author name string	wds:Q60487769-20761752-5ADE-440F-AE65-4AE7AD0854CF wds:Q60487769-2546F00E-3ADF-4C2A-B009-1F1697841C66 wds:Q60487769-3E2194B8-CBDE-432A-BF3E-7A615CE9E6C5 wds:Q60487769-61968014-901A-4E15-B3DB-587A7D764BA9 wds:Q60487769-732945B2-4F87-4878-94F9-66404DBB6E93
author name string	Randi Holmestad Knut Marthinsen Christophe R. Birkeland Jian Min Zuo Ragnvald H�ier
rdfs:label	Use of quantitative convergent-beam electron diffraction in materials science (en) Use of quantitative convergent-beam electron diffraction in materials science (nl)
skos:prefLabel	Use of quantitative convergent-beam electron diffraction in materials science (en) Use of quantitative convergent-beam electron diffraction in materials science (nl)
name	Use of quantitative convergent-beam electron diffraction in materials science (en) Use of quantitative convergent-beam electron diffraction in materials science (nl)
title	wds:Q60487769-F82DF3A7-612C-4074-8453-6EE0B5A506D2
title	Use of quantitative convergent-beam electron diffraction in materials science (en)
page(s)	wds:Q60487769-AD980E24-349D-423C-A38A-E3625761CA8C
page(s)	130-145
instance of	wds:Q60487769-DA68457F-DB21-4513-BFB9-3B7AEC32B34C
instance of	scholarly article
main subject	wds:Q60487769-4CB3980E-39F4-4673-A39E-E1ADB1947A76 wds:Q60487769-6399A0AA-EA98-41D4-8B6E-C22C018CEA00
main subject	materials science medical laboratory technology
published in	wds:Q60487769-FC2EA342-3D6E-45C3-B51D-DBC0D07A3318
published in	Microscopy Research and Technique
issue	wds:Q60487769-6F66CE52-68D3-486A-A842-9807CF870951
volume	wds:Q60487769-29FA94A4-9F39-4A3F-882D-D98C95A834EF
issue	2
volume	46
DOI	wds:Q60487769-51450CCE-50A2-4F51-A92F-E29074A02614
DOI	http://dx.doi.org/10.1002/(SICI)1097-0029(19990715)46:2%3C130::AID-JEMT6%3E3.0.CO;2-O
DOI	10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q60487769
is cites work of	A quantitative analysis of the cone-angle dependence in precession electron diffraction. Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fitting Charge defects glowing in the dark. CBED contrast in the lower order Laue zone. Electron diffraction structure analysis: structural research with low-quality diffraction data
is cites work of	wds:Q51276763-812F5EA5-FB61-48E4-A76D-F947B204F900 wds:Q41631002-BB5990F5-7154-4B04-B93B-1140D4550315 wds:Q50912543-CBD6AFEF-C3BC-40B0-BCE4-8E4667BA5299 wds:Q51100218-21EE2B22-B0CF-44D0-9895-A1AA238F1EA3 wds:Q64028330-8A5C5759-D5F1-4E5E-B0F3-7F0BE90EC2B2

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