About: A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy

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About: A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy Goto Sponge NotDistinct Permalink

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rdf:type	Item
description	article (en) wetenschappelijk artikel (nl) наукова стаття, опублікована в травні 2000 (uk) article scientifique publié en 2000 (fr) im Mai 2000 veröffentlichter wissenschaftlicher Artikel (de)
publication date	wds:Q59749637-C1C5F982-8145-4F04-9AE5-A56526BC3DC0
publication date	2000-05-01 00:00:00Z (xsd:dateTime)
cites work	wds:Q59749637-3430E4B0-B3BE-4CB5-AA55-6C400FE8E50A wds:Q59749637-41AD8434-248F-4E35-AE71-E0AF51C0755E wds:Q59749637-6A4043D9-EC5C-4BAB-97F1-8A0B797F3C3A wds:Q59749637-981E53A2-C076-48C1-9D70-0E7F4D0F0646
cites work	Band bending and the apparent barrier height in scanning tunneling microscopy. Scanning tunneling microscopy of insulators and biological specimens based on lateral conductivity of ultrathin water films Elimination of spectral shifts associated with tip-induced band bending in scanning tunneling spectroscopy of lightly doped silicon Doping-density dependence of scanning tunneling spectroscopy on lightly doped silicon
author name string	wds:Q59749637-29194E7C-6FE8-4971-9E35-F65C071C0682 wds:Q59749637-E0772165-E671-4617-A485-0BF9DDB0FB03
author name string	Hai-An Lin Ralph J. Jaccodine
rdfs:label	A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy (en) A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy (nl)
skos:prefLabel	A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy (en) A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy (nl)
name	A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy (en) A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy (nl)
author	wds:Q59749637-E8B60399-7FB0-4432-8335-1D70E2FE79C2
author	Michael S. Freund
title	wds:Q59749637-47FCD769-2970-4069-83E3-185B84C58719
title	A reverse bias, tip-insulator-semiconductor tunnel diode model accounting for the delineation of a p/p+ junction using scanning tunneling microscopy (en)
page(s)	wds:Q59749637-B9923B19-0D82-4260-B407-8C0C5842F08F
page(s)	4476-4482
instance of	wds:Q59749637-D4D032A0-984C-48A3-87FF-100B783D128F
instance of	scholarly article
main subject	wds:Q59749637-C79A5A3A-67C8-4EDE-A2E0-1C6DB321E832 wds:Q59749637-D1F18D7A-25DF-44C2-8DD8-68ADA8A74C2D
main subject	semiconductor bias
published in	wds:Q59749637-50537E27-349E-49CA-8243-98DEAB534B28
published in	Journal of Applied Physics
issue	wds:Q59749637-1ADC4696-1041-4BCD-BD09-5266CD007AA3
volume	wds:Q59749637-5ADFE645-7A5A-4F48-916C-2B2381B7AC7B
issue	9
volume	87
DOI	wds:Q59749637-E8127574-F2B9-4E0B-8614-57D5A8F2F19E
DOI	http://dx.doi.org/10.1063/1.373094
DOI	10.1063/1.373094
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q59749637

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