About: High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment

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scholarly article in Physical Review B, vol. 79 no. 21, June 2009

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) article scientifique publié en 2009 (fr) наукова стаття, опублікована в червні 2009 (uk) im Juni 2009 veröffentlichter wissenschaftlicher Artikel (de) scholarly article in Physical Review B, vol. 79 no. 21, June 2009 (en)
publication date	wds:Q59707233-7968385E-925E-4D62-B5C8-3E09A0F49C27
publication date	2009-06-17 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q59707233-D48367E0-8736-4163-BB49-E3F54241100C
language of work or name	English
author name string	wds:Q59707233-39657903-550E-4C06-B021-899BD81FAF69 wds:Q59707233-9637A75C-7AC5-45EA-8A80-EF077812320A wds:Q59707233-ED5609A2-86BE-4499-9FB7-45AFF4930E60
author name string	Allan J. Jacobson Xiqu Wang Leslie J. Allen
rdfs:label	High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment (en) High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment (nl)
skos:prefLabel	High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment (en) High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment (nl)
name	High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment (en) High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment (nl)
author	wds:Q59707233-162869A3-75D2-4221-80A7-AC067C99418C wds:Q59707233-59A36C54-DC6E-43EE-B220-7209AE8E53F0 wds:Q59707233-E867F938-EC4C-4B1C-BC90-43D07676C086
author	Scott D. Findlay James M. LeBeau Susanne Stemmer
title	wds:Q59707233-83C5A7B9-90B1-46DA-B732-A349260FB80C
title	High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment (en)
instance of	wds:Q59707233-94A3749D-4F3B-4DB0-B5BF-D0016F19DCDF
instance of	scholarly article
published in	wds:Q59707233-99239EA4-B35B-4AE9-9F04-BB5658EB816E
published in	Physical Review B
issue	wds:Q59707233-BE900C86-54D9-4AB1-90DC-4E7CFDF698FB
volume	wds:Q59707233-64365FF8-3C09-436C-8475-FD481BE1154F
issue	21
volume	79
DOI	wds:Q59707233-BB02A2A8-4C95-4CB1-870C-DC0449843352
DOI	http://dx.doi.org/10.1103/PHYSREVB.79.214110
DOI	10.1103/PHYSREVB.79.214110
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q59707233
is cites work of	Quantitative annular dark field electron microscopy using single electron signals Identifying hexagonal boron nitride monolayers by transmission electron microscopy Position averaged convergent beam electron diffraction: theory and applications. Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM Optimal experimental design for nano-particle atom-counting from high-resolution STEM images Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts. Measurement of effective source distribution and its importance for quantitative interpretation of STEM images Thermal diffuse scattering in transmission electron microscopy. Rapid measurement of nanoparticle thickness profiles Quantitative STEM normalisation: The importance of the electron flux. Interface location by depth sectioning using a low-angle annular dark field detector Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy. Efficient elastic imaging of single atoms on ultrathin supports in a scanning transmission electron microscope Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images. The spatial coherence function in scanning transmission electron microscopy and spectroscopy. Simulation of scanning transmission electron microscope images on desktop computers Detector non-uniformity in scanning transmission electron microscopy. Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary Bloch wave simulations in the frozen lattice approximation Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Channelling contrast analysis of lattice images: Conditions for probe-insensitive STEM Compositional Analysis with Atomic Column Spatial Resolution by 5th-Order Aberration-Corrected Scanning Transmission Electron Microscopy Study on probe current dependence of the intensity distribution in annular dark field images Experimental evaluation of interfaces using atomic-resolution high angle annular dark field (HAADF) imaging Multislice frozen phonon high angle annular dark-field image simulation study of Mo-V-Nb-Te-O complex oxidation catalyst "M1" Modelling of AlAs/GaAs interfacial structures using high-angle annular dark field (HAADF) image simulations Limits in detecting an individual dopant atom embedded in a crystal Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy. Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM). Image formation mechanisms of spherical aberration corrected BF STEM imaging methods Near field and exit wave computations for electron microscopy Measuring the areal density of nanomaterials by electron energy-loss spectroscopy
is cites work of	wds:Q34284741-497641BA-A150-4FAB-9330-B145F61A1F9F wds:Q57432661-E14E69D8-62ED-4E1B-BA5C-F82A7787BD1D wds:Q62617281-5E4AD97B-5C68-4314-A9AF-B0D90D8C51B8 wds:Q87123454-3483E6BB-EBDD-4199-AB36-43EF6311E30A wds:Q35512595-19459FB2-C434-4F9D-B542-D1E2C70C74B6 wds:Q34398517-35D33A42-C20E-431E-A0B8-52F03EB0CFC0 wds:Q63790161-B01C70D5-2C05-401F-9D53-A9449F2B4DCA wds:Q57935851-BC9EB0C6-CD09-4DAE-80A5-268E75C96C1B wds:Q84446044-7DCF3816-26CC-4A2A-890F-B021515E66EF wds:Q34473118-8B27291F-A302-489F-A311-26EB21B81738 wds:Q34315468-3A975A43-E8E4-462F-B7B7-D342A646A64D wds:Q33956202-37F90CC8-23D9-4CD4-B5B1-0EB5593063A2 wds:Q45961111-FC029B36-8ABE-454B-9095-45F0FF1E7F1E wds:Q35759292-F2383DAD-A2EF-47A9-B4D8-DB19E657861B wds:Q44915666-224AA0F1-12F2-4D90-BC23-C95687C057C9 wds:Q33519791-0238D472-E16F-48F5-AA0B-885B180F44FF wds:Q34473111-91CFF451-5857-4AB7-AE2A-C310C38FF05A wds:Q35017449-C876698B-0FC9-4893-9ED1-9C878FC3E21C wds:Q82612412-0E33BAD9-600A-44E8-9E86-FDB50E514F37 wds:Q51080228-FD437D18-C492-4FA7-A4BA-274DA57C29A4 wds:Q51496919-B291440E-4BA0-4A76-B38B-72B229F1AF52 wds:Q63790171-FFA592F0-FBD5-4D75-B413-364A3D964B37 wds:Q39651186-07141BAC-FE90-4BD2-AF88-221B8BABA0BB wds:Q34768783-CBDFD9A6-AAA2-4C49-916C-3B1784B8DCCC wds:Q47962687-56815517-2243-4F1B-8BD0-8438D5191B50

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