About: Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy

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scholarly article in Physical Review B, vol. 84 no. 7, August 2011

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в серпні 2011 (uk) article scientifique publié en 2011 (fr) im August 2011 veröffentlichter wissenschaftlicher Artikel (de) scholarly article in Physical Review B, vol. 84 no. 7, August 2011 (en)
publication date	wds:Q59395062-1BE48674-7BBA-4BEC-9725-67ED7AC032A4
publication date	2011-08-17 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q59395062-E34CA683-9402-4162-A836-B60198AD5ED8
language of work or name	English
author name string	wds:Q59395062-3858C412-E323-42BA-95AB-25EAE326BE1C wds:Q59395062-6DC87302-2ECF-4FE4-BAB2-070710D2C395 wds:Q59395062-9814A069-F750-41C1-9C0F-4F5736741460 wds:Q59395062-AF0EC2CE-8083-40B9-BA21-83317AE68C27
author name string	L. Fitting Kourkoutis V. Vaithyanathan D. A. Muller M. K. Parker
rdfs:label	Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy (en) Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy (nl)
skos:prefLabel	Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy (en) Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy (nl)
name	Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy (en) Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy (nl)
author	wds:Q59395062-4C50FD2E-39EA-4B9A-94B8-823976E5D402
author	Darrell G. Schlom
title	wds:Q59395062-ED4C7B7F-DC2F-45A0-BFDC-285F55602D66
title	Direct measurement of electron channeling in a crystal using scanning transmission electron microscopy (en)
instance of	wds:Q59395062-FE4F7BF7-EE57-4D6F-B530-BB2496C0BF6C
instance of	scholarly article
published in	wds:Q59395062-AAFD771B-4A51-45BF-8A84-75EAADE2CDF7
published in	Physical Review B
issue	wds:Q59395062-2690CDC4-4900-4939-9F3F-69912CA64299
volume	wds:Q59395062-F02926C5-B2F6-474F-ADCC-9CE2F1764C50
issue	7
volume	84
DOI	wds:Q59395062-D9CC34ED-A2D0-45F4-B575-19ACA0AEC065
DOI	http://dx.doi.org/10.1103/PHYSREVB.84.075485
DOI	10.1103/PHYSREVB.84.075485
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q59395062
is cites work of	Identifying hexagonal boron nitride monolayers by transmission electron microscopy Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM Quantitative position-averaged K-, L-, and M-shell core-loss scattering in STEM Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric. Determining the thickness of atomically thin MoS2 and WS2 in the TEM. Three-dimensional imaging of individual point defects using selective detection angles in annular dark field scanning transmission electron microscopy. Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM). STEM beam channeling in BaSnO3/LaAlO3 perovskite bilayers and visualization of 2D misfit dislocation network High-resolution scanning transmission electron microscopy (HRSTEM) techniques: high-resolution imaging and spectroscopy side by side
is cites work of	wds:Q34284741-6926F7C5-A814-491A-A5C4-8A8E8ADB126A wds:Q53519813-5973A3AC-F098-45A3-809E-21E263438406 wds:Q91091443-EB6F8FAC-F080-4447-AD17-5B81C24E9516 wds:Q47962687-E2E5B943-0F5C-47F9-831A-2B39F1606813 wds:Q51117854-D3E50654-280E-4034-86DB-53A3F7F9170D wds:Q84071779-BDD05CA7-1642-4795-96FB-9BBF5656A5A8 wds:Q83225165-8C901264-A2E0-4FB1-82C2-2A55BC9990FE wds:Q50868621-82EB5727-F188-4E90-B144-77A31AF9C499 wds:Q87855080-8C8A130F-B2FD-4B01-B392-7C263F8726D0

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