About: Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy

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scientific article published in Nature

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rdf:type	Item
description	artículu científicu (ast) wetenschappelijk artikel (nl) article publié dans la revue scientifique Nature (fr) im Mai 2003 veröffentlichter wissenschaftlicher Artikel (de) scientific article published in Nature (en) наукова стаття, опублікована в Nature в травні 2003 (uk)
publication date	wds:Q59059051-5D1273D8-A405-4FDB-8AB2-59EECB49C165
publication date	2003-05-01 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q59059051-98A82169-08AA-4C98-820B-30A463C47B52
language of work or name	English
exact match	wds:Q59059051-8A53F853-C8A5-4092-8952-57BD54A8EBE2
exact match	https://scigraph.springernature.com/pub.10.1038/nature01638
cites work	wds:Q59059051-55290058-15A1-416A-AEE2-5C7C35BD9E25 wds:Q59059051-6328CBE3-C2EB-40B5-B297-48F316643674 wds:Q59059051-83651720-2DE7-42D6-82A0-18CD9B05CAAB wds:Q59059051-A9922D81-8741-4B20-8A3F-E4FE6182D54B
cites work	Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry A crystal structure determined with 0.02 Å accuracy by electron microscopy Probability calculus for quantitative HREM. Part I: Monte-Carlo and point cloud techniques.
author name string	wds:Q59059051-6D946503-4952-4087-BF49-F82992D4E8E2 wds:Q59059051-7CD7CA6D-209B-4990-BA87-F3BCFD3376BA
author name string	Martin J Hÿtch Jean-Michel Pénisson
rdfs:label	Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy (en) Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy (nl)
skos:prefLabel	Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy (en) Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy (nl)
name	Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy (en) Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy (nl)
author	wds:Q59059051-5C5F0C9A-5418-48AF-94DA-69AED0EB6568
author	Jean-Luc Putaux
title	wds:Q59059051-EA2CD551-D791-43A9-9E88-5090B21F0CE6
title	Measurement of the displacement field of dislocations to 0.03 A by electron microscopy (en)
page(s)	wds:Q59059051-7CDE45E3-A6FE-4227-98E5-76E75DA3EE95
page(s)	270-273
instance of	wds:Q59059051-AB764C7F-E569-4B04-AC6D-05443BF2BD34
instance of	scholarly article
main subject	wds:Q59059051-0A545602-0791-4A23-97B9-7C5F34D029FF
main subject	microscopy
PubMed ID	wds:Q59059051-744154EB-E898-422C-9215-EF99D8D82ABB
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/12748637
PubMed ID	12748637
published in	wds:Q59059051-6E833C02-B967-4A6F-A1DE-2124F6C31E42
published in	Nature
issue	wds:Q59059051-2B412824-13AE-47A9-B9C9-25CEE80E6208
volume	wds:Q59059051-72E99C93-9D09-4C0A-8DB0-073F93E597F5
issue	6937
volume	423
DOI	wds:Q59059051-A2579F52-10E4-424B-8657-C682B363F11E
DOI	http://dx.doi.org/10.1038/NATURE01638
DOI	10.1038/NATURE01638
Dimensions Publication ID	wds:Q59059051-9D41D383-E213-472E-9223-9F91A709F854
Dimensions Publication ID	1004752811
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q59059051
is cites work of	Implications for plastic flow in the deep mantle from modelling dislocations in MgSiO3 minerals A route for a strong increase of critical current in nanostrained iron-based superconductors High-strength and thermally stable bulk nanolayered composites due to twin-induced interfaces Nanoscale holographic interferometry for strain measurements in electronic devices Atomic origins of the high catalytic activity of nanoporous gold Theoretical discussions on the geometrical phase analysis Resolving strain in carbon nanotubes at the atomic level. Nanoscale waviness of low-angle grain boundaries Ferromagnetic dislocations in antiferromagnetic NiO. Effects of strain gradients on strain measurements using geometrical phase analysis in the transmission electron microscope Impact of misfit dislocations on the polarization instability of epitaxial nanostructured ferroelectric perovskites. Breaking through the strength-ductility trade-off dilemma in an Al-Si-based casting alloy On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns Atomic configurations at InAs partial dislocation cores associated with Z-shape faulted dipoles Distortion and segregation in a dislocation core region at atomic resolution. Energy-filtered transmission electron microscopy based on inner-shell ionization Boosting Hole Mobility in Coherently Strained [110]-Oriented Ge-Si Core-Shell Nanowires Polymorphism of dislocation core structures at the atomic scale. Three-dimensional imaging of dislocation propagation during crystal growth and dissolution BATTERIES. Topological defect dynamics in operando battery nanoparticles. Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO3/SrTiO3 epitaxial thin films Cs-corrected scanning transmission electron microscopy investigation of dislocation core configurations at a SrTiO(3)/MgO heterogeneous interface High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations. Morphology and strain of self-assembled semipolar GaN quantum dots in (112¯2) AlN Atomic diffusion within individual gold nanocrystal. Identifying Defects with Guided Algorithms in Bragg Coherent Diffractive Imaging Three-dimensional imaging of dislocation dynamics during the hydriding phase transformation. Superdislocations and point defects in pyrochlore YbTiO single crystals and implication on magnetic ground states Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval ZnCr₂O₄ Inclusions in ZnO Matrix Investigated by Probe-Corrected STEM-EELS Three-dimensional X-ray diffraction imaging of dislocations in polycrystalline metals under tensile loading The effect of scanning jitter on geometric phase analysis in STEM images Bubble nucleation and migration in a lead-iron hydr(oxide) core-shell nanoparticle The heterogeneous nucleation of threading dislocations on partial dislocations in III-nitride epilayers High resolution atomic scale characterization of dislocations in high entropy alloys: Critical assessment of template matching and geometric phase analysis The Relationship Between Atomic Structure and Strain Distribution of Misfit Dislocation Cores at Cubic Heteroepitaxial Interfaces Full-Field Strain Mapping at a Ge/Si Heterostructure Interface Dislocation reactions, grain boundaries, and irreversibility in two-dimensional lattices using topological tweezers Enhanced oxidation of nanoparticles through strain-mediated ionic transport. Linking a completely three-dimensional nanostrain to a structural transformation eigenstrain. Nanoscale strain fields research of boundaries between B2 matrix and G.P. zone in Ni-Ti alloy thin films. Localized concentration reversal of lithium during intercalation into nanoparticles. Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting. Strain field mapping of dislocations in a Ge/Si heterostructure

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