About: Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2

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scholarly article in Physical Review B, vol. 88 no. 3, July 2013

Attributes	Values
rdf:type	Item
description	artículu científicu (ast) wetenschappelijk artikel (nl) наукова стаття, опублікована в липні 2013 (uk) article scientifique publié en 2013 (fr) im Juli 2013 veröffentlichter wissenschaftlicher Artikel (de) scholarly article in Physical Review B, vol. 88 no. 3, July 2013 (en)
publication date	wds:Q58871238-156ACA6C-0A93-446F-8CA2-6706677E9FDE
publication date	2013-07-15 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q58871238-43CC2430-648E-48DF-9760-0CC1209B4EDB
language of work or name	English
cites work	wds:Q58871238-6F32568E-EAD1-494B-9746-ED57A1CCEC66 wds:Q58871238-75954326-5993-44D2-9A19-4554C5A8F3CE wds:Q58871238-8833A94A-5274-4FB4-811C-76696B62F7AA wds:Q58871238-BEE89F39-1A01-4573-B61B-EC5217A34DF9 wds:Q58871238-E4754A7F-3182-4CDB-BA96-20BBD27D58E6 wds:Q58871238-FB03D20B-FE1D-44F6-9A42-C3CCB1389DBD
cites work	Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering Dynamics of solid thin-film dewetting in the silicon-on-insulator system Agglomeration dynamics of germanium islands on a silicon oxide substrate: A grazing incidence small-angle x-ray scattering study Dynamics, anisotropy, and stability of silicon-on-insulator dewetting fronts Dewetting dynamics of silicon-on-insulator thin films Thermal instability of silicon-on-insulator thin films measured by low-energy electron microscopy
author name string	wds:Q58871238-1C0AB8D1-1677-4D05-9F8B-58AFE82B7CAF
author name string	T. Passanante
rdfs:label	Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2 (en) Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2 (nl)
skos:prefLabel	Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2 (en) Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2 (nl)
name	Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2 (en) Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2 (nl)
author	wds:Q58871238-06EEAD9A-5209-4C6D-B76E-657B885C1406 wds:Q58871238-483EC898-DC6C-4D05-A12A-33654119B131 wds:Q58871238-88D4C79F-91A7-4BF7-8C50-EDD1EA3498F6
author	Fabien Cheynis Pierre Müller Frederic Leroy
title	wds:Q58871238-AC4DAA83-2DFB-4AEB-B2F1-7D9607F7135E
title	Influence of facets on solid state dewetting mechanisms: Comparison between Ge and Si onSiO2 (en)
instance of	wds:Q58871238-13C32EC2-8DE9-4195-AAFF-21424EC60FA4
instance of	scholarly article
published in	wds:Q58871238-EB59D3FC-E320-49D0-BEF9-A1601025E0D7
published in	Physical Review B
issue	wds:Q58871238-A0762E81-6F60-4A0F-939E-BD283958D766
volume	wds:Q58871238-356A8A32-4E15-41C2-AC78-3726F49EB45C
issue	3
volume	88
DOI	wds:Q58871238-CFAAD5FA-2EA3-402A-853E-B8684BC04381
DOI	http://dx.doi.org/10.1103/PHYSREVB.88.035306
DOI	10.1103/PHYSREVB.88.035306
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q58871238
is cites work of	Oxygen-induced inhibition of silicon-on-insulator dewetting Templated Solid-State Dewetting of Thin Silicon Films. Dewetting of patterned solid films: Towards a predictive modelling approach Dewetting behavior of Ge layers on SiO2 under annealing
is cites work of	wds:Q58871227-C227ECDC-E2E1-41EC-8A05-FB9EF87871F2 wds:Q46336460-5902661F-AFCB-4889-9B7A-E4AA913D5797 wds:Q58871202-3E489B56-B691-4754-B075-277EADBB6CC5 wds:Q98463567-D2C7B8C7-0E11-4D8D-96D4-06651E92C053

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