About: Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering

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scholarly article in Physical Review B, vol. 81 no. 20, May 2010

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в травні 2010 (uk) im Mai 2010 veröffentlichter wissenschaftlicher Artikel (de) scholarly article in Physical Review B, vol. 81 no. 20, May 2010 (en)
publication date	wds:Q58809983-886A9937-AD90-4E7B-AC95-22DF9EC27B1D
publication date	2010-05-21 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q58809983-3863984A-2477-4D82-BC4E-033E552899E8
language of work or name	English
cites work	wds:Q58809983-02B4E565-300E-43D0-9F12-F7CA1CAC217E wds:Q58809983-0502F269-4359-418E-8AE7-F678E234069E wds:Q58809983-16CC9B17-D802-4390-B9F8-3642083B1A26 wds:Q58809983-1972C5B7-DFBB-4A22-BEDB-D04887A8D877 wds:Q58809983-1E2E8238-6AFB-4892-A2A1-F21BDC719F44 wds:Q58809983-28C54296-1D9F-4D9E-B282-46DD38B5C2D4 wds:Q58809983-30250F3D-58E7-48F3-A4E8-37C6A12B46E7 wds:Q58809983-68BD9C47-2CAF-4339-8032-617E74BE8F7D wds:Q58809983-6F8E3825-9705-44EF-8675-AA5031DF4F04 wds:Q58809983-87E362EF-4968-42E0-91E5-BA49A6A776A7 wds:Q58809983-9E1AEAD1-5047-4C5D-980A-CC783A5BB756 wds:Q58809983-AF62333F-DC53-4F53-B24E-D949FB814317 wds:Q58809983-E81E1A7E-3F20-4CDF-98D3-E6C65FB07E5D wds:Q58809983-F1861BEF-24A0-4DAC-BC8C-8B071239682F
cites work	Origin of complex impact craters on native oxide coated silicon surfaces Generalized Gradient Approximation Made Simple Improved adsorption energetics within density-functional theory using revised Perdew-Burke-Ernzerhof functionals X-ray-induced dissociation of H2O and formation of an O2-H2 alloy at high pressure Preparation of fine silicon particles from amorphous silicon monoxide by the disproportionation reaction Crystal structure prediction from first principles. An extraction algorithm for core-level excitations in non-resonant inelastic X-ray scattering spectra. Tetrahydrofuran clathrate hydrate formation. Role of Non-Hydrogen-Bonded Molecules in the Oxygen K-Edge Spectrum of Ice X-ray Raman scattering at the L edges of elemental Na, Si, and the N edge of Ba in Ba8Si46 Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering Phase separation and nanocrystal formation in GeO Temperature-induced obliteration of sub-oxide interfaces in amorphous GeO X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
author name string	wds:Q58809983-0B03E91A-EBFC-40EA-9C48-276E2AB7010B wds:Q58809983-163E8D43-A968-4AAC-BE83-7257E4BA9BDF wds:Q58809983-51CB78B9-3F46-40B0-87E6-0CA472620FFA wds:Q58809983-63BE36CB-AA85-417C-81E9-27B0D99807C5 wds:Q58809983-6AC22B7B-9EE7-4CC6-B56A-8B957970F2CD wds:Q58809983-8FFB9E36-7B79-4F92-B4BF-177F486EF907 wds:Q58809983-A93AFD1B-2538-4150-A348-3D7711D11D11 wds:Q58809983-C2A6D181-F302-4885-A03C-6994EA8D4D34 wds:Q58809983-F30E33BE-259D-4585-9AF4-A38D8CD0B9AF
author name string	F. Djurabekova H. Conrad M. Tolan G. T. Seidler A. Hohl A. Sakko Ch. J. Sahle H. Sternemann O. M. Feroughi
rdfs:label	Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering (en) Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering (nl)
skos:prefLabel	Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering (en) Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering (nl)
name	Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering (en) Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering (nl)
author	wds:Q58809983-61E82620-46D1-4BBD-9361-055F96654116 wds:Q58809983-7F0907AA-CB77-4194-B5EF-E18604F5ED17
author	Keijo Hämäläinen Christian Sternemann
title	wds:Q58809983-F6F07BB0-4966-4323-8969-377F3CF295EF
title	Suboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering (en)
instance of	wds:Q58809983-F6AF29FB-CFED-4631-BC85-33C9676ECE88
instance of	scholarly article
published in	wds:Q58809983-2CFDEE10-4E63-4ED5-8289-F4DCAAF88746
published in	Physical Review B
issue	wds:Q58809983-1AE99D3C-3E28-44A8-AA05-77DB4AAC94FF
volume	wds:Q58809983-CEDB3B43-3106-4FE9-8FAD-9B49A13EAF2E
issue	20
volume	81
DOI	wds:Q58809983-71A7DCFD-ABEF-41D3-92FB-1339A5C6ADF9
DOI	http://dx.doi.org/10.1103/PHYSREVB.81.205317
DOI	10.1103/PHYSREVB.81.205317
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q58809983
is cites work of	Atomic-scale disproportionation in amorphous silicon monoxide. Inelastic X-ray scattering and vibrational effects at the K-edges of gaseous N2, N2O, and CO2 Spectroscopy of low and intermediateZelements at extreme conditions:in situstudies of Earth materials at pressure and temperature via X-ray Raman scattering Reexamining the Lyman-Birge-Hopfield band of N2
is cites work of	wds:Q57394918-A280FC70-2FCE-4532-9909-DF05183CDCBA wds:Q36907212-2A741055-38FC-49F2-B803-7270E1DEFA89 wds:Q58809950-C80C491F-49B6-4DA1-86E2-F94B659F3061 wds:Q58810211-68E1C981-4225-44D6-9013-5D1024191BA9

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