About: Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy

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About: Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy Goto Sponge NotDistinct Permalink

An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

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rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в лютому 2015 (uk) im Februar 2015 veröffentlichter wissenschaftlicher Artikel (de)
publication date	wds:Q58226924-6C99D151-0FE8-495F-8934-50F21F87D931
publication date	2015-02-06 00:00:00Z (xsd:dateTime)
author name string	wds:Q58226924-761B016E-2A43-468A-BB92-7241F0CD0EE4 wds:Q58226924-842563B1-3896-43BE-B137-D79542AD40A7 wds:Q58226924-A67219F6-A13A-4346-B84F-4F40975C9B57 wds:Q58226924-B04F7E20-D4CA-4315-8580-1DE102BCB4CB
author name string	Hirofumi Yamada Kei Kobayashi Kei Noda Yuji Yamagishi
rdfs:label	Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy (en) Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy (nl)
skos:prefLabel	Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy (en) Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy (nl)
name	Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy (en) Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy (nl)
title	wds:Q58226924-D7474D30-8CC0-403A-8E50-39A9E7456303
title	Interlayer Resistance and Edge-Specific Charging in Layered Molecular Crystals Revealed by Kelvin-Probe Force Microscopy (en)
page(s)	wds:Q58226924-9D46BC83-A13C-41D5-99CC-D7CAEA4E2F41
page(s)	3006-3011
instance of	wds:Q58226924-1D37A3C0-59AC-4B7F-938A-E4A2CE8BF924
instance of	scholarly article
published in	wds:Q58226924-F3895E52-16EE-4A8F-B840-32CD40EEA4FE
published in	Journal of Physical Chemistry C
issue	wds:Q58226924-A43978EF-2769-4C0C-ADEE-157F90140CD3
volume	wds:Q58226924-ABD9C80D-5BA4-44A6-B0B7-1F9E4EC771B4
issue	6
volume	119
number of pages	wds:Q58226924-6648E488-277A-4D47-B135-F18FD1853D49
number of pages	6 (xsd:decimal)
DOI	wds:Q58226924-E881E0A4-378F-4D6A-A0FC-D2F785EF0321
DOI	http://dx.doi.org/10.1021/ACS.JPCC.5B00611
DOI	10.1021/ACS.JPCC.5B00611
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q58226924
is cites work of	Crystal step edges can trap electrons on the surfaces of n-type organic semiconductors. The correlations of the electronic structure and film growth of 2,7-diocty[1]benzothieno[3,2-b]benzothiophene (C8-BTBT) on SiO2.
is cites work of	wds:Q54940184-D193E97B-3D16-4E95-BF88-84D0DF907346 wds:Q48894767-2A0B09E7-FC3F-45A7-90BF-78784CE9B4B7

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