About: Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products     Goto   Sponge   NotDistinct   Permalink

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rdf:type
description
  • article (en)
  • artículu científicu (ast)
  • wetenschappelijk artikel (nl)
  • article scientifique publié en 2015 (fr)
  • наукова стаття, опублікована в січні 2015 (uk)
  • im Januar 2015 veröffentlichter wissenschaftlicher Artikel (de)
publication date
publication date
author name string
author name string
  • J. R. Kimmel
  • H. Stark
  • J. T. Jayne
  • A. T. Lambe
  • P. Davidovits
  • P. S. Chhabra
rdfs:label
  • Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products (en)
  • Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products (nl)
skos:prefLabel
  • Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products (en)
  • Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products (nl)
name
  • Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products (en)
  • Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products (nl)
author
author
title
title
  • Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products (en)
page(s)
page(s)
  • 1-18
instance of
instance of
published in
published in
issue
volume
issue
  • 1
volume
  • 8
DOI
DOI
DOI
  • 10.5194/AMT-8-1-2015
copyright license
copyright status
copyright license
copyright status
is about of
is cites work of
is cites work of
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