About: Angus J. Wilkinson

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Professor of Materials Science at the University of Oxford

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rdf:type	Item
description	forskare (sv) 연구원 (ko) 研究者 (ja) araştırmacı (tr) wetenschapper (nl) дослідник (uk) эрдэмтэн (mn) изилдөөчү (ky) Professor of Materials Science at the University of Oxford (en)
rdfs:label	Angus J Wilkinson (nl) Angus J. Wilkinson (en) Angus J. Wilkinson (es)
skos:prefLabel	Angus J Wilkinson (nl) Angus J. Wilkinson (en) Angus J. Wilkinson (es)
name	Angus J Wilkinson (nl) Angus J. Wilkinson (en) Angus J. Wilkinson (es)
Scopus author ID	wds:Q57556015-0304E71E-5F33-4AC1-A0A3-3C51DEEF450B
Scopus author ID	7201828998
given name	wds:Q57556015-48B20A5C-EFA5-4A73-B77E-D37A1FF4B666
given name	Angus
instance of	wds:Q57556015-665C4C16-B738-431E-997F-83B8BB21592F
instance of	Homo sapiens
zbMATH author ID	wds:Q57556015-E891287D-9266-4FE0-AD11-40DB326BBB49
doctoral student	wds:Q57556015-3b3a6e6c-4cd3-affb-ac45-877523a516f3
Google Knowledge Graph ID	wds:Q57556015-0609905A-84BE-43B6-9CC9-B465A1B26EEC
Google Knowledge Graph ID	http://g.co/kg/g/11h639dqmp
zbMATH author ID	wilkinson.angus-j
doctoral student	Ben Britton
Google Knowledge Graph ID	/g/11h639dqmp
Google Scholar author ID	wds:Q57556015-58a060c4-4c3d-f323-d4a4-7e21dc7af2dc
Google Scholar author ID	StycLbQAAAAJ
skos:altLabel	A J Wilkinson (en) Angus Wilkinson (en) A.J. Wilkinson (en) A. J. Wilkinson (en) Angus J Wilkinson (en)
occupation	wds:Q57556015-605EA7B4-BCD8-4030-B2F1-FB5E53122C5A
employer	wds:Q57556015-03CC1CC4-4D89-4F5A-8399-9863D70E6E95
X username	wds:Q57556015-067F0272-059F-4445-BDD6-C3837B20FC04
sex or gender	wds:Q57556015-a76ea827-4129-736b-72ac-5616b4cf6c16
maintained by WikiProject	wds:Q57556015-7283FF30-2EB7-445D-8797-65F3119C68F7
family name	wds:Q57556015-45086BB5-3306-46AB-A26E-DC5C0FB90308
occupation	researcher
employer	University of Oxford
X username	AngusJWilkinson
sex or gender	male
maintained by WikiProject	WikiProject Mathematics
family name	Wilkinson
ORCID iD	wds:Q57556015-9026AAFB-4B40-4617-B6B8-52E689639A19
Dimensions author ID	wds:Q57556015-BAC56DF4-67CB-4CE1-B5A3-0CBA1FE1016D
ORCID iD	https://orcid.org/0000-0002-8801-4102
ORCID iD	0000-0002-8801-4102
Dimensions author ID	011737323052.44
ResearcherID	wds:Q57556015-FB81C5D9-BCC2-4BC5-AC2D-D916176169BE
ResearcherID	E-4849-2011
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q57556015 Angus Wilkinson
is author of	Measurement of elastic strains and small lattice rotations using electron back scatter diffraction. Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti–6Al–4V alloy High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity Mapping strains at the nanoscale using electron back scatter diffraction Electron diffraction based techniques in scanning electron microscopy of bulk materials Strains, planes, and EBSD in materials science Direct detection of electron backscatter diffraction patterns. Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction Size effects resolve discrepancies in 40 years of work on low-temperature plasticity in olivine Stress fields and geometrically necessary dislocation density distributions near the head of a blocked slip band Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration Accumulation of geometrically necessary dislocations near grain boundaries in deformed copper Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction A new method for determining small misorientations from electron back scatter diffraction patterns High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations. Dislocation Interactions in Olivine Revealed by HR-EBSD The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements The effect of crystal orientation on the indentation response of commercially pure titanium: experiments and simulations Controlling the orientation, edge geometry, and thickness of chemical vapor deposition graphene Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size. Evolution of intragranular stresses and dislocation densities during cyclic deformation of polycrystalline copper The orientation and strain dependence of dislocation structure evolution in monotonically deformed polycrystalline copper Mapping type III intragranular residual stress distributions in deformed copper polycrystals Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction Measurement of probability distributions for internal stresses in dislocated crystals Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets Introduction Fabrication of biaxially textured Ni substrates and LaNiO/sub 3/ buffer layers for Tl-1223 thick films Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope Dislocation density distribution at slip band-grain boundary intersections Mapping the full lattice strain tensor of a single dislocation by high angular resolution transmission Kikuchi diffraction (HR-TKD) Quantitative deformation studies using electron back scatter patterns On the depth resolution of transmission Kikuchi diffraction (TKD) analysis Using transmission Kikuchi diffraction to study intergranular stress corrosion cracking in type 316 stainless steels High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction 〈a〉 Prismatic, 〈a〉 basal, and 〈c+a〉 slip strengths of commercially pure Zr by micro-cantilever tests Probing Deformation and Revealing Microstructural Mechanisms with Cross-Correlation-Based, High-Resolution Electron Backscatter Diffraction

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