scholarly article in Physical Review B, vol. 85 no. 3, January 2012

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rdf:type
description
  • wetenschappelijk artikel (nl)
  • article scientifique publié en 2012 (fr)
  • наукова стаття, опублікована в січні 2012 (uk)
  • im Januar 2012 veröffentlichter wissenschaftlicher Artikel (de)
  • 2012 ജനുവരി 17 നു പ്രസിദ്ധീകരിച്ച ശാസ്ത്ര ലേഖനം (ml)
  • scholarly article in Physical Review B, vol. 85 no. 3, January 2012 (en)
publication date
publication date
language of work or name
language of work or name
author name string
author name string
  • Soon Cheol Hong
  • J. D. Lee
  • S. W. Han
  • In Gee Kim
rdfs:label
  • Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te) (en)
  • Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te) (nl)
skos:prefLabel
  • Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te) (en)
  • Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te) (nl)
name
  • Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te) (en)
  • Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te) (nl)
author
author
title
title
  • Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te) (en)
instance of
instance of
main subject
main subject
published in
published in
issue
volume
issue
  • 3
volume
  • 85
DOI
DOI
DOI
  • 10.1103/PHYSREVB.85.033305
Fatcat ID
Fatcat ID
  • release_ekzu3tgz5zbjdimf62vsehn6zy
is about of
is cites work of
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