About: Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope

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scientific article published on 12 November 2019

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) article scientifique publié en 2019 (fr) im November 2019 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu en payares de 2019 (ast) scientific article published on 12 November 2019 (en) 2019 թվականի նոյեմբերի 12-ին հրատարակված գիտական հոդված (hy) наукова стаття, опублікована 12 листопада 2019 (uk)
publication date	wds:Q91398199-24E4AA62-FFC0-4E93-B4E0-CEE54BC50C7F
publication date	2019-11-12 00:00:00Z (xsd:dateTime)
cites work	wds:Q91398199-A7BCBFFA-C342-4F96-8FED-ED44BE8DA803 wds:Q91398199-B1D14501-63F1-4574-9346-68B27AA4173B wds:Q91398199-F9C76302-DB44-482C-9F7C-FF0A2CEBCF95
cites work	Mechanism for secondary electron dopant contrast in the SEM Field-emission SEM imaging of compositional and doping layer semiconductor superlattices Why is it possible to detect doped regions of semiconductors in low voltage SEM: a review and update
author name string	wds:Q91398199-445A98B1-30B6-4374-8DD9-B3A6627FB49A wds:Q91398199-BBFEBB4A-E3F8-429A-9D04-19C13B931496 wds:Q91398199-EF06FA38-337F-4410-ADA2-91C2F14DBEF9 wds:Q91398199-F28AE9AE-C91C-4786-BFB6-DF5C92A37CB1
author name string	Yoichiro Hashimoto Yu Yamazawa Takeshi Sunaoshi Shuichi Takeuchi
rdfs:label	Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope (en) Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope (nl)
skos:prefLabel	Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope (en) Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope (nl)
name	Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope (en) Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope (nl)
title	wds:Q91398199-D357B35D-22E4-4670-8B7C-64CB5E288CEE
title	Voltage contrast imaging with energy filtered signal in a field-emission scanning electron microscope (en)
page(s)	wds:Q91398199-DD2BD3C1-2D28-41D8-A4CC-809AA1F65503
page(s)	112889
instance of	wds:Q91398199-4CCEF5A7-5D2C-4693-A049-BD9A0592815B
instance of	scholarly article
PubMed ID	wds:Q91398199-4B6628C4-0445-4038-9882-81E388A57D07
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/31756599
PubMed ID	31756599
published in	wds:Q91398199-C778E72E-1014-4512-BDC6-DEDC947F23B5
published in	Ultramicroscopy
volume	wds:Q91398199-2F9390F8-E975-4E6C-9F85-A59EE5FB009D
volume	209
DOI	wds:Q91398199-386D2A45-A7BE-4AFB-9AE2-BA62A5FBF51C
DOI	http://dx.doi.org/10.1016/J.ULTRAMIC.2019.112889
DOI	10.1016/J.ULTRAMIC.2019.112889
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q91398199
is cites work of	Quantitative material analysis using secondary electron energy spectromicroscopy
is cites work of	wds:Q104495248-B58373BA-5213-46BB-B5BD-0B019AE9F097

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