About: Complementary techniques for the characterization of thin film Ti/Nb multilayers

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scientific article published on 06 June 2009

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в червні 2009 (uk) im Juni 2009 veröffentlichter wissenschaftlicher Artikel (de) scientific article published on 06 June 2009 (en) artículu científicu espublizáu en xunu de 2009 (ast)
publication date	wds:Q84121760-43B5D90D-94EE-430E-84F3-D6AB0AA384F9
publication date	2009-06-06 00:00:00Z (xsd:dateTime)
cites work	wds:Q84121760-0B505F8F-1728-47D0-AEFC-2CCFDC2B3A54 wds:Q84121760-1011A7CE-C9BE-4097-AE2E-1C90B1875FCC wds:Q84121760-452E9198-2DB8-4C0D-B21E-ADA7D779ABC8 wds:Q84121760-799EFCED-3EE4-4AE7-9399-38113D36EB8C wds:Q84121760-C70578D7-1CFC-4116-BB80-D67CC891CA7B wds:Q84121760-E7964E23-FAEE-4451-BD9C-08B393A225CE wds:Q84121760-F634E401-F3FF-45A7-A946-691D04856B48
cites work	Some aspects of atom probe specimen preparation and analysis of thin film materials. Incoherent Imaging of Crystals Using Thermally Scattered Electrons EELS in the STEM: Determination of materials properties on the atomic scale Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy. Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction. Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy Measurement of electron beam broadening in stainless steels during EDS analysis in the FEG-TEM
author name string	wds:Q84121760-25E12D7E-782E-4929-A2ED-604157F63457 wds:Q84121760-4BF98927-D312-41FE-87E5-97E045F8D7A7 wds:Q84121760-7FD5A357-CA36-4EEA-9821-4694F57D921D wds:Q84121760-86F859F1-A6EF-438E-9FAA-418C826F626E wds:Q84121760-90CEDB80-92DB-4251-A59F-67D6636B380D wds:Q84121760-CDDAD995-903A-4831-9410-1950A0B0C18A
author name string	Rajarshi Banerjee Andrew W Johnson Gregory B Thompson Hamish L Fraser Arda Genç Dennis M Maher
rdfs:label	Complementary techniques for the characterization of thin film Ti/Nb multilayers (en) Complementary techniques for the characterization of thin film Ti/Nb multilayers (nl)
skos:prefLabel	Complementary techniques for the characterization of thin film Ti/Nb multilayers (en) Complementary techniques for the characterization of thin film Ti/Nb multilayers (nl)
name	Complementary techniques for the characterization of thin film Ti/Nb multilayers (en) Complementary techniques for the characterization of thin film Ti/Nb multilayers (nl)
title	wds:Q84121760-2D437491-C23D-4592-8D64-3700EF2D4310
title	Complementary techniques for the characterization of thin film Ti/Nb multilayers (en)
page(s)	wds:Q84121760-6019BE8E-CE63-431F-A38A-4A642FCEE24F
page(s)	1276-1281
instance of	wds:Q84121760-EDF100C4-616E-49B3-BC67-AD9241C004AA
instance of	scholarly article
main subject	wds:Q84121760-3F8EE314-C76E-4738-BB34-32CC29EBB30B
main subject	thin film
PubMed ID	wds:Q84121760-D4A1B83D-C9C2-46C7-8744-A00BDE6CE2CD
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/19553019
PubMed ID	19553019
published in	wds:Q84121760-ADF03D36-AF3D-4559-BA6C-5A5551B3561B
published in	Ultramicroscopy
issue	wds:Q84121760-EBDB6295-3A74-4157-A7BD-F80E831F8FB6
volume	wds:Q84121760-8ED1C65F-F5E6-47D4-A8D0-6D427E65660F
issue	10
volume	109
DOI	wds:Q84121760-5B243DFE-98E2-406C-8C81-BEEE749794F8
DOI	http://dx.doi.org/10.1016/J.ULTRAMIC.2009.05.015
DOI	10.1016/J.ULTRAMIC.2009.05.015
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q84121760
is cites work of	When will Low-Contrast Features be Visible in a STEM X-Ray Spectrum Image?
is cites work of	wds:Q35684651-70F0ADE3-AB44-4115-A594-7FA68FFAA083

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