About: First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM

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scientific article published on 01 April 2005

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) article scientifique publié en 2005 (fr) наукова стаття, опублікована у квітні 2005 (uk) im April 2005 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu n'abril de 2005 (ast) scientific article published on 01 April 2005 (en)
publication date	wds:Q81861139-AA1CD736-7E97-4968-8396-E419F4E98D36
publication date	2005-04-01 00:00:00Z (xsd:dateTime)
author name string	wds:Q81861139-3D8EAA90-6099-4375-8A9B-7E82F8DF9F10 wds:Q81861139-4601A045-B12A-43C5-BD96-95CC04B2ACBD wds:Q81861139-C52234C9-9F79-4FFA-B8A9-FEDCB6D535D0
author name string	Nobuo Tanaka Hidetaka Sawada Jun Yamasaki
rdfs:label	First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM (en) First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM (nl)
skos:prefLabel	First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM (en) First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM (nl)
name	First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM (en) First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM (nl)
title	wds:Q81861139-61222699-2A6A-486D-AFA3-CB1C4B360381
title	First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM (en)
page(s)	wds:Q81861139-D0740E32-46C5-4489-830F-D8BF0004BD36
page(s)	123-126
instance of	wds:Q81861139-BB4A150B-A78B-4264-888C-56ABBD63B463
instance of	scholarly article
main subject	wds:Q81861139-DA994D92-F10B-4810-B98F-606590FB87D0
main subject	nanotechnology
PubMed ID	wds:Q81861139-1C6650AF-B233-4486-B695-C77A74EF97F1
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/15961407
PubMed ID	15961407
published in	wds:Q81861139-A09862A4-5EA2-4E28-9758-6F58779F1933
published in	Journal of Electron Microscopy
issue	wds:Q81861139-FD52EEDD-C44B-4D0A-B8E1-EA1FB747AB24
volume	wds:Q81861139-B4CA8606-C8ED-4049-AF6E-A45EB6E73B16
issue	2
volume	54
DOI	wds:Q81861139-0E095416-7526-4CB6-BC7C-6E051CB02360
DOI	http://dx.doi.org/10.1093/JMICRO/DFI028
DOI	10.1093/JMICRO/DFI028
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q81861139
is cites work of	Development of Aberration-Corrected Electron Microscopy Strain mapping in selected area electron diffraction method combining a Cs-corrected TEM with a stage scanning system Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials∗ Measurement of spatial coherence of electron beams by using a small selected-area aperture. Combining real and reciprocal space information for aberration free coherent electron diffractive imaging.
is cites work of	wds:Q34939844-5A899766-27B9-4D56-A3AF-8D23F11F9328 wds:Q39017575-A7AA62D8-0873-4971-9154-F9F7FF9D4695 wds:Q34643453-059CB02A-BE3F-425F-B272-5F451C4D8A0F wds:Q29037973-B6A2C22B-54DF-4770-AF2C-79719928002D wds:Q51610130-5A40FC34-DB46-43EE-A356-B41AD7CBF1CC

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