About: Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces

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About: Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces Goto Sponge NotDistinct Permalink

An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

scientific article published on 01 April 1991

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована у квітні 1991 (uk) article scientifique publié en 1991 (fr) im April 1991 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu n'abril de 1991 (ast) scientific article published on 01 April 1991 (en)
publication date	wds:Q78204350-D1B60D82-5BF0-43E4-8402-ABAC4328FC31
publication date	1991-04-01 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q78204350-99AC4432-A8CF-4D01-B686-A6C89DB53D11
language of work or name	English
cites work	wds:Q78204350-4C76E892-00B5-4B24-8BE4-C6A1264C0FA0 wds:Q78204350-516B91A9-A0AB-455E-B307-D362EFAF440E wds:Q78204350-97E10729-981F-459E-8325-349E27908413 wds:Q78204350-A6EA53E2-32BA-497B-B9A1-D2F230B904A9 wds:Q78204350-B3971BBD-B95B-426B-844B-07872822E9FC wds:Q78204350-BDEF7FAD-4896-4CEC-A705-C70C05D1336D
cites work	Monte Carlo Methods Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy Observation of interface band structure by ballistic-electron-emission microscopy Electron mean-free-path calculations using a model dielectric function Direct spectroscopy of electron and hole scattering Ballistic-hole spectroscopy of interfaces
author name string	wds:Q78204350-70EAB692-FC0B-469A-AC7A-3B9979C1A237 wds:Q78204350-DC265E8D-2E4A-47CB-A57E-625592F498F1
author name string	Lee EY Schowalter LJ
rdfs:label	Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces (en) Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces (nl)
skos:prefLabel	Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces (en) Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces (nl)
name	Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces (en) Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces (nl)
title	wds:Q78204350-7C7854D2-4506-484A-B9BD-9659789E6529
title	Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces (en)
page(s)	wds:Q78204350-BC5E27B2-C951-4EA3-950A-0CA1621A8C53
page(s)	9308-9311
instance of	wds:Q78204350-49F9026E-5AF2-4E2E-B8D6-6B61D6D49925
instance of	scholarly article
PubMed ID	wds:Q78204350-18A17FC0-8B5A-4AF3-A867-29ECACF303F8
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/9996614
PubMed ID	9996614
published in	wds:Q78204350-387F2956-E94C-45CC-9D69-E67F30F627AC
published in	Physical Review B
issue	wds:Q78204350-9801CFB3-73BE-4CA3-BBB1-E1C8245DDE33
volume	wds:Q78204350-ADD51BB7-B5CE-4A78-BEF6-3C6AEC6755DA
issue	11
volume	43
DOI	wds:Q78204350-14260FFD-772D-4005-B82F-B269E7679426
DOI	http://dx.doi.org/10.1103/PHYSREVB.43.9308
DOI	10.1103/PHYSREVB.43.9308
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q78204350
is cites work of	Theory of ballistic-electron-emission spectroscopy of NiSi2/Si(111) interfaces Direct determination of impact ionization quantum yield in Si by ballistic-electron-emission microscopy Electron-hole pair creation and metal/semiconductor interface scattering observed by ballistic-electron-emission microscopy Novel transport effects in high-bias ballistic-electron-emission spectroscopy Hot electron scattering processes in metal films and at metal-semiconductor interfaces Probing hot-carrier transport and elastic scattering using ballistic-electron-emission microscopy Ballistic-electron-emission microscopy of strained Si1-xGex layers Nonmonotonic bias voltage dependence of the magnetocurrent in GaAs-based magnetic tunnel transistors. Hot-electron lifetimes in metals: A combinedab initiocalculation and ballistic electron emission spectroscopy analysis Evidence of Momentum Conservation at a Nonepitaxial Metal/Semiconductor Interface using Ballistic Electron Emission Microscopy Quantum transmittance from low-temperature ballistic electron emission spectroscopy of Au/Si(100) Schottky interfaces Ballistic-electron-emission-microscopy investigation of hot-carrier transport in epitaxialCoSi2films on Si(100) and Si(111)
is cites work of	wds:Q74549865-1899156E-646A-49F6-8BEC-AE54579E9D39 wds:Q74535695-909C4A5F-2888-4E17-A7C2-D96C0957CF9D wds:Q74538826-6C294913-C195-4978-AC13-C48AF2CB67D6 wds:Q74508082-3EACB3C9-98DA-428C-9FC5-3EF4AF4F8EE9 wds:Q78113058-CFDAE357-31D1-45FF-80CB-FA2178B4F54D wds:Q66671720-F3B0A205-8F5E-417A-A62E-DC3BB0282880 wds:Q60149567-9EA94CC4-379E-441A-BFA5-7BB39E455754 wds:Q74366704-F193C220-705A-47EC-BDC9-9A7CE40EE33F wds:Q74540644-D80FBB13-147E-4547-BBE2-3E9F8DC11FCF wds:Q59820657-07B53D18-66D3-48CF-BCF5-A9929C6F02EA wds:Q74572495-052A055B-C7C4-4A84-933E-69F405F03984 wds:Q52951866-891C95AC-1BB7-4654-AEE7-33C8611E8F1F

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