About: Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films Goto Sponge NotDistinct Permalink

An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

article published in 2017

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в лютому 2017 (uk) im Februar 2017 veröffentlichter wissenschaftlicher Artikel (de) article published in 2017 (en)
publication date	wds:Q63958402-120F397C-6110-4A39-AC35-DB9D2AA3880E
publication date	2017-02-01 00:00:00Z (xsd:dateTime)
author name string	wds:Q63958402-3391E87D-CFA4-41F2-8B44-91281E131865 wds:Q63958402-5C670B97-6BB8-4F90-9137-D2EDB2D7E3E4 wds:Q63958402-933946E5-7984-4CC0-8EB4-A3A031B40203 wds:Q63958402-D6FB4920-F86F-41BD-A044-62C8E4B354D2 wds:Q63958402-F79B6A04-A18F-4A8A-A897-40CF09E20E60
author name string	A.J. Wilkinson G. Naresh-Kumar M. Nouf-Allehiani P. Gamarra M.A. di Forte-Poisson
rdfs:label	Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (en) Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (nl)
skos:prefLabel	Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (en) Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (nl)
name	Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (en) Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (nl)
author	wds:Q63958402-8E7F3996-4C05-49FB-A69A-819A7E839412 wds:Q63958402-93C03403-00CD-4F5C-9D79-66799E82AF33
author	Carol Trager-Cowan Arantxa Vilalta-Clemente
title	wds:Q63958402-16335180-6172-4DB3-ACF0-2DC73B12E4FE
title	Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (en)
page(s)	wds:Q63958402-23A94D63-1A95-4FD9-A058-30AD594B1078
page(s)	125-135
instance of	wds:Q63958402-82C46C09-AFD1-432D-BDBE-59EF16919DED
instance of	scholarly article
main subject	wds:Q63958402-7E69088D-5A78-4E28-BB98-B2AA573D7B0B
main subject	thin film
published in	wds:Q63958402-C57A5AB1-2CC3-46FC-B60F-BE9B10E82276
published in	Acta Materialia
volume	wds:Q63958402-BC545B2D-8867-4978-9FCA-E4971D38B8B4
volume	125
DOI	wds:Q63958402-568968B7-3A5E-43F9-80C2-4B47CCC6ACF4
DOI	http://dx.doi.org/10.1016/J.ACTAMAT.2016.11.039
DOI	10.1016/J.ACTAMAT.2016.11.039
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q63958402
is cites work of	Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations. Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction. EBSD pattern simulations for an interaction volume containing lattice defects Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction
is cites work of	wds:Q47622276-659FDA21-A94E-4CBC-B04A-734E041BBE5D wds:Q61728119-6DE29163-C7E3-422C-BF03-220F1A64522C wds:Q98388362-F10F1D7D-969B-448E-9805-58FED5E38CF4 wds:Q47694917-D1990801-03C9-42CA-8F7E-70AFDB52C9B5 wds:Q41649916-DF2E5864-A8AE-4ED3-A009-0BBF047D218F wds:Q63958388-01C06122-A2D9-477B-AD5E-C110BAB5C749 wds:Q92557220-91AAA002-C818-4429-8CBD-8239461DA7F6

Faceted Search & Find service v1.16.117 as of May 05 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3239 as of May 5 2024, on Linux (x86_64-centos_6-linux-gnu), Single-Server Edition (378 GB total memory, 183 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2025 OpenLink Software