About: Field-ion specimen preparation using focused ion-beam milling

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About: Field-ion specimen preparation using focused ion-beam milling Goto Sponge NotDistinct Permalink

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rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована у вересні 1999 (uk) im September 1999 veröffentlichter wissenschaftlicher Artikel (de)
publication date	wds:Q62618038-EC934BE6-1865-46A3-BE5F-D47E8487A3DE
publication date	1999-09-01 00:00:00Z (xsd:dateTime)
cites work	wds:Q62618038-68B8B2C7-160D-482B-93C9-8191293290A9
cites work	Giant Magnetoresistance of (001)Fe/(001)Cr Magnetic Superlattices
author name string	wds:Q62618038-17FA13FE-3329-481F-BF80-A626F2F00CDC wds:Q62618038-1D328B87-0F4A-4C8C-A310-7CDAB01DDD85 wds:Q62618038-68AB0623-FB04-4AA2-861B-34FF4E006D06 wds:Q62618038-798880D5-4773-4F32-AB72-418BCFA51B11 wds:Q62618038-79CF3C75-DD10-4E4B-99DC-92F94E49291B wds:Q62618038-C8DD1A04-94FF-4A21-ABA7-2F14F2E0BEF9 wds:Q62618038-D0DDA84F-C115-4F89-9236-2112BF5D362A
author name string	A Cerezo M.G Blamire G.D.W Smith A.K Petford-Long D.J Larson D.T Foord H Liew
rdfs:label	Field-ion specimen preparation using focused ion-beam milling (en) Field-ion specimen preparation using focused ion-beam milling (nl)
skos:prefLabel	Field-ion specimen preparation using focused ion-beam milling (en) Field-ion specimen preparation using focused ion-beam milling (nl)
name	Field-ion specimen preparation using focused ion-beam milling (en) Field-ion specimen preparation using focused ion-beam milling (nl)
title	wds:Q62618038-5FD928EB-79AF-4ECD-A952-A0AA36933C98
title	Field-ion specimen preparation using focused ion-beam milling (en)
page(s)	wds:Q62618038-7BBBB971-49BF-474E-8569-22A256BBE156
page(s)	287-293
instance of	wds:Q62618038-8DC67EB8-3D93-46F9-90C1-B01C6DB011AB
instance of	scholarly article
published in	wds:Q62618038-DD8D0F40-01C6-4739-9FCF-AD8C2D4E63DF
published in	Ultramicroscopy
issue	wds:Q62618038-342F1BA0-F47F-4EEF-A977-396F5135D093
volume	wds:Q62618038-2EC7E1F6-9D97-4852-9D7C-68071F13B564
issue	1-4
volume	79
DOI	wds:Q62618038-CF43150B-7C85-4D09-9B4F-600DFAAF401D
DOI	http://dx.doi.org/10.1016/S0304-3991(99)00055-8
DOI	10.1016/S0304-3991(99)00055-8
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q62618038
is cites work of	Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporation Fabrication of specimens of metamorphic magnetite crystals for field ion microscopy and atom probe microanalysis Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms 3DAP analysis of (Ga,Mn)As diluted magnetic semiconductor thin film Some aspects of atom probe specimen preparation and analysis of thin film materials. In situ site-specific specimen preparation for atom probe tomography Atom probe tomography today On the use of simulated field-evaporated specimen apex shapes in atom probe tomography data reconstruction Reconstructing atom probe data: a review Elemental Distribution in Multilayer Systems by Laser-Assisted Atom Probe Tomography with Various Analysis Directions Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomography. Shaping the lens of the atom probe: Fabrication of site specific, oriented specimens and application to grain boundary analysis Review of atom probe FIB-based specimen preparation methods Overview: recent progress in three-dimensional atom probe instruments and applications Atom probe specimen preparation with a dual beam SEM/FIB miller Atom probe specimen fabrication methods using a dual FIB/SEM Strategies for fabricating atom probe specimens with a dual beam FIB Combined nano-SIMS/AFM/EBSD analysis and atom probe tomography, of carbon distribution in austenite/ε-martensite high-Mn steels Atomic scale investigation on the distribution of boron in medium carbon steels by atom probe tomography and EELS Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: an electron tomography and aberration-corrected high-resolution ADF-STEM study Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders Three-Dimensional Nanoscale Mapping of State-of-the-Art Field-Effect Transistors (FinFETs). Development of atom probe specimen preparation techniques for specific regions in steel materials Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography Atomic-Scale Analytical Tomography A computational geometry framework for the optimisation of atom probe reconstructions Encapsulation method for atom probe tomography analysis of nanoparticles. Analysis of implanted silicon dopant profiles. Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films (invited) Nanometer scale tomographic investigation of fine scale precipitates in a CuFeNi granular system by three-dimensional field ion microscopy Observations of Si field evaporation Three-dimensional atom mapping of boron in implanted silicon. 3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor Materials Solid state reaction in sandwich-type Al/Cu thin films Characterization of Nanoporous Materials with Atom Probe Tomography FANM: A software for focus and aberrations of nuclear microprobe Multiple double cross-section transmission electron microscope sample preparation of specific sub-10 nm diameter Si nanowire devices A simple approach to atom probe sample preparation by using shadow masks Decline of giant impacts on Mars by 4.48 billion years ago and an early opportunity for habitability Fabrication of Needle-Shaped Specimens Containing Subsurface Nanostructures for Electron Tomography Methods for atom probe analysis of microgradients in functionally graded cemented carbides Application of a focused ion beam system to micro and nanoengineering Characteristics of a high brightness gaseous field ion source employing tungsten-carbon doped NiAl needles Compositional boundary layers trigger liquid unmixing in a basaltic crystal mush In Situ Atom Probe Deintercalation of Lithium-Manganese-Oxide. On the Analysis of Clustering in an Irradiated Low Alloy Reactor Pressure Vessel Steel Weld.
is cites work of	wds:Q35499048-046F2294-0292-4745-A86C-FFD4D4606BFF wds:Q33402056-8AD3ADA2-5CCC-44B7-A224-20DB9C94FA23 wds:Q35776522-D254853A-139C-4686-8CAD-2FA64D02ADEA wds:Q37000858-5FA7CB57-5050-491B-B298-4645CC6C66C5 wds:Q43494202-EE025F82-023B-49C2-8B3B-1BB55CA13BFC wds:Q51616590-3A81254C-37D6-468F-9FDB-4D77C01B89D0 wds:Q82220095-CC33C147-7C63-4AC6-9B42-C722D62B8C57

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