About: Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

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About: Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques Goto Sponge NotDistinct Permalink

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Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована у вересні 1997 (uk) im September 1997 veröffentlichter wissenschaftlicher Artikel (de)
publication date	wds:Q62395026-C2269CE0-95B9-4155-8656-51072CE66DFF
publication date	1997-09-01 00:00:00Z (xsd:dateTime)
cites work	wds:Q62395026-12E47E6C-197B-40F8-A43C-EE721F90E185 wds:Q62395026-1B558C99-A415-47E6-8977-A047A150D651 wds:Q62395026-337FF9FB-71B6-4474-A2D5-30DA0C173400 wds:Q62395026-7503A0C5-2895-4A45-ACAA-D743DDDBC6E5 wds:Q62395026-8C72957B-E729-4E7D-B03A-5245D794B5F1 wds:Q62395026-A90A6326-E70F-4C20-BC97-FD31148F8139 wds:Q62395026-A94D8E8A-CEBE-46A0-8632-BA9242E41EC2 wds:Q62395026-EE103A54-6955-4BFE-B6BB-F7C1714D63CB wds:Q62395026-FE5F9DFC-A91A-4921-8CB8-487E3C2FFB87
cites work	Nonspecular x-ray reflection from rough multilayers Strain relaxation during the initial stages of growth in Ge/Si(001). InAs/GaAs pyramidal quantum dots: Strain distribution, optical phonons, and electronic structure Vertically self-organized InAs quantum box islands on GaAs(100) Self-Organization in Growth of Quantum Dot Superlattices InAs/GaAs quantum dots radiative recombination from zero-dimensional states Prevention of gain saturation by multi-layer quantum dot lasers Coherent islands and microstructural evolution Strain in Nanoscale Germanium Hut Clusters on Si(001) Studied by X-Ray Diffraction
author name string	wds:Q62395026-08B58A62-9AD8-424F-BC21-62450CBF7472 wds:Q62395026-0E0DF8CC-B162-4913-AC5B-FBF78A149771 wds:Q62395026-6BF12552-2CDB-4E4E-A493-91AFC9826DA6 wds:Q62395026-71C1DA5E-54D5-47E5-AD39-5F8410FDD2A9 wds:Q62395026-7659DF70-E651-4636-B073-0CA40535F4F1 wds:Q62395026-AB5D8E76-436C-457B-A649-0BE72CC9C7EB wds:Q62395026-AF7E5287-B519-42D7-BD3B-212D06F68B3C wds:Q62395026-D564022C-27F3-4C6A-BF84-AC1B4D1E7838 wds:Q62395026-F2FB1A96-84D8-4838-A7DA-33E0723654BD wds:Q62395026-FA83F401-6360-4BE0-AA26-4DB3F43E61BF
author name string	G. Bauer J. Stangl P. Werner M. Grundmann A. Krost V.M. Ustinov V. Holy A.A. Darhuber P.S. Kop'ev A.O. Kosogov
rdfs:label	Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques (en) Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques (nl)
skos:prefLabel	Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques (en) Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques (nl)
name	Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques (en) Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques (nl)
author	wds:Q62395026-D8EEF294-B177-4838-9C87-73D7C94DA5C1
author	Dieter Bimberg
title	wds:Q62395026-8C28E544-3DB0-43FE-B4D3-5C1741E99540
title	Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques (en)
page(s)	wds:Q62395026-D89AB77D-8DEF-45AA-A217-65AA7FB748D1
page(s)	198-204
instance of	wds:Q62395026-09A3511E-C3D3-4EF0-A73B-1E3E78E289B1
instance of	scholarly article
main subject	wds:Q62395026-01F33C9B-BD5B-4BE4-9A19-268649D21D65 wds:Q62395026-8101C1DC-0CC6-4992-ABA0-FBE5F39FD5D9 wds:Q62395026-B88A9A6C-CC14-405F-BF1D-3B24EB4BAC05
main subject	quantum dot X-ray diffraction self-assembly
published in	wds:Q62395026-DF0E39DA-BB23-4F8F-BC1B-2B5DE00AD60B
published in	Thin Solid Films
issue	wds:Q62395026-5BAF6AA5-E81C-4452-B1FE-8BE4BB4C1875
volume	wds:Q62395026-2BB17B3C-E1A2-4B64-842F-BC6728E67E33
issue	2
volume	306
DOI	wds:Q62395026-B2913C9E-D0D0-437F-B1E3-02F55FE1079C
DOI	http://dx.doi.org/10.1016/S0040-6090(97)00097-7
DOI	10.1016/S0040-6090(97)00097-7
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q62395026

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