About: Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy

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article by Sascha Sadewasser et al published 3 December 2003 in Nanotechnology

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в грудні 2003 (uk) article scientifique publié en 2003 (fr) im Dezember 2003 veröffentlichter wissenschaftlicher Artikel (de) article by Sascha Sadewasser et al published 3 December 2003 in Nanotechnology (en)
publication date	wds:Q61826083-E45AF962-9CC9-495D-93B7-FD9A98398775
publication date	2003-12-03 00:00:00Z (xsd:dateTime)
author name string	wds:Q61826083-3389ADF3-7D2C-4726-8E5E-959864A4AB17 wds:Q61826083-8F679316-F532-4420-9DD4-67AC4D1A5EC3
author name string	Philippe Carl Martha Ch Lux-Steiner
rdfs:label	Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy (en) Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy (nl)
skos:prefLabel	Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy (en) Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy (nl)
name	Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy (en) Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy (nl)
author	wds:Q61826083-409FFED0-37BA-4E8B-AA74-3F4AE0B3EC1C wds:Q61826083-67E660BF-0083-4621-A5E0-0F956C3E4C79
author	Thilo Glatzel Sascha Sadewasser
title	wds:Q61826083-27115D4B-EA90-4544-BC20-00FA688255BA
title	Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy (en)
page(s)	wds:Q61826083-2CEC0532-A49A-4C34-B542-4F9B24FEE2E9
page(s)	S14-S18
instance of	wds:Q61826083-F4789772-F40B-4FE2-8423-65DA4BA85A2D
instance of	scholarly article
published in	wds:Q61826083-BAEB55F9-B4B9-4C05-9902-7475F8C87420
published in	Nanotechnology
issue	wds:Q61826083-69D1DB3C-EEDE-4656-9451-B77114BE0189
volume	wds:Q61826083-E78BBB47-B4E3-4089-9096-89DC7506910E
issue	2
volume	15
DOI	wds:Q61826083-205BB832-294C-4D6F-B53C-31D02E081C88
DOI	http://dx.doi.org/10.1088/0957-4484/15/2/004
DOI	10.1088/0957-4484/15/2/004
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q61826083
is cites work of	Dual frequency atomic force microscopy on charged surfaces Contrast inversion in non-contact Dynamic Scanning Force Microscopy: what is high and what is low? Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
is cites work of	wds:Q33540499-1FE1541A-AA57-44DD-B228-A44B60ABFADF wds:Q44495806-E6FFFAC4-FEEC-44A0-90C8-C840F4137C4E wds:Q36389794-B012BA6B-FC53-44A2-A4A6-ABF33DC947A0

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