About: Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum

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About: Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum Goto Sponge NotDistinct Permalink

An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в серпні 2005 (uk) im August 2005 veröffentlichter wissenschaftlicher Artikel (de)
publication date	wds:Q58320097-6C0B1FB3-B8BA-48D7-8F91-0C18FE87D450
publication date	2005-08-22 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q58320097-EDCAF291-3EC1-4604-84CB-2D0E6D695C7D
language of work or name	English
cites work	wds:Q58320097-248E0342-2EA2-4C5B-91B0-CF5431F23825 wds:Q58320097-7F6C0F25-88AE-48EC-B944-0E04AB6959D5 wds:Q58320097-917B81DC-2C26-4596-BE10-53E339D8E0BC wds:Q58320097-AC71B2BD-3078-4B17-9F35-8CE00410AAB5 wds:Q58320097-BB96F081-A14A-400C-8F83-19B0AC010444 wds:Q58320097-CDC7A64E-D5B5-4AF7-B500-9CD4E45B00C7 wds:Q58320097-EC90A31E-C339-4437-A6E7-69126445E777
cites work	Advances in atomic force microscopy Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite. Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy. Double quartz tuning fork sensor for low temperature atomic force and scanning tunneling microscopy Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3(0001) surface. Atomic structure of alkali halide surfaces
author name string	wds:Q58320097-57ABAEA8-D0C7-48C4-AC63-B982C31D6CED wds:Q58320097-9BEC985F-B91E-42F9-9F13-25F14587C407 wds:Q58320097-9DF08BF4-5F3E-469D-B29A-6D9009D58855 wds:Q58320097-EEA1DF64-7E5B-4290-B120-2A2028E34CFE
author name string	H.-J. Freund H.-P. Rust M. Heyde M. Sterrer
rdfs:label	Atomic resolution on MgO (nl) Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum (en)
skos:prefLabel	Atomic resolution on MgO (nl) Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum (en)
name	Atomic resolution on MgO (nl) Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum (en)
title	wds:Q58320097-C0DA6204-CB98-407D-A328-F1CF50D6D476
title	Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum (en)
page(s)	wds:Q58320097-313F6435-3E6B-4EF5-AED0-AB74B27AB80A
page(s)	083104
instance of	wds:Q58320097-E38D618B-0043-442F-A473-77948E8E5547
instance of	scholarly article
published in	wds:Q58320097-1C2F68A2-4D0D-4759-BBF7-C8D30C5A903B
published in	Applied Physics Letters
issue	wds:Q58320097-9B841066-33E5-4964-B2EF-3867FCA26B3C
volume	wds:Q58320097-797439C5-05BB-4D6E-9929-C3EF48A148F2
issue	8
volume	87
DOI	wds:Q58320097-4F8C48D1-08E2-4C22-95F3-F45AC553CB50
DOI	http://dx.doi.org/10.1063/1.2012523
DOI	10.1063/1.2012523
describes a project that uses	wds:Q58320097-930512B3-022F-4447-BA38-3C1619CA483E
describes a project that uses	atomic force microscopy
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q58320097
is cites work of	Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy Recent trends in surface characterization and chemistry with high-resolution scanning force methods. Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique Atomically resolved force microscopy images of complex surface unit cells: Ultrathin alumina film on NiAl(110) Atomic resolution on a metal single crystal with dynamic force microscopy Resolving oxide surfaces - From point and line defects to complex network structures Measurement of shear strength for HOPG with scanning tunneling microscopy by thermal excitation method Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces Frequency-modulated atomic force spectroscopy on NiAl(110) partially covered with a thin alumina film Enhanced atomic corrugation in dynamic force microscopy—The role of repulsive forces
is cites work of	wds:Q24598728-C256CA45-88F5-4B0B-9494-AC5796400AF3 wds:Q83738856-0203E9C2-4D42-4DDB-A84D-A007D9A463B4 wds:Q59001855-BC868A65-CC4D-439D-8BA4-CEF2F7F4238D wds:Q58319948-507737A3-08EB-4CB0-AF8C-12BFEAE9366F wds:Q33326302-248EECA9-F241-4408-856D-26D8F797DB81 wds:Q37831265-AEB8E6EE-27E1-4518-9EFB-FAE84DF672E8 wds:Q58320010-ED1CC1AF-D215-4A0A-BC82-EFF58C50F176 wds:Q58320033-076BBD84-7C99-4B22-B943-FD4E4586D038 wds:Q58066115-5D4D528F-527C-4F7D-8A09-7325082584FC wds:Q58320076-620F7CC8-00BE-46DC-BA63-CD15AAACB5E7

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