About: Thickness dependence of dielectric properties in bismuth layer-structured dielectrics

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scholarly article by Kenji Takahashi et al published 21 August 2006 in Applied Physics Letters

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) article scientifique publié en 2006 (fr) наукова стаття, опублікована в серпні 2006 (uk) im August 2006 veröffentlichter wissenschaftlicher Artikel (de) scholarly article by Kenji Takahashi et al published 21 August 2006 in Applied Physics Letters (en)
publication date	wds:Q58193377-B3F992E0-42E3-44FA-89D1-3D315B79B8D2
publication date	2006-08-21 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q58193377-DFDD18D8-DB64-49DE-A3B2-7CAD837A38FC
language of work or name	English
cites work	wds:Q58193377-DBCD99B5-9ACB-47CC-A5DF-F715BD2F7B95
cites work	Beamline for Surface and Interface Structures at SPring-8
author name string	wds:Q58193377-0E2989A5-F1B2-4552-AB83-0F42EC3CAB71 wds:Q58193377-1AF7F8C3-B0D2-4090-BB79-66173C45B4ED wds:Q58193377-545BCE1F-8228-448F-9664-2C3A4828059E wds:Q58193377-54763168-835F-454A-BD64-997E3C012D4E wds:Q58193377-DFDE29CD-0640-4EC0-B91F-FBEA3772CCC8
author name string	Takashi Kojima Kenji Takahashi Hiroshi Funakubo Kazushi Sumitani Yukio Sakashita
rdfs:label	Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (en) Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (nl)
skos:prefLabel	Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (en) Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (nl)
name	Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (en) Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (nl)
author	wds:Q58193377-11B10C9D-084A-408B-9510-4A9817A711EA wds:Q58193377-66FE9EB2-C14C-4788-89C7-B25769C6E710 wds:Q58193377-E5A9559B-D4F9-433A-811E-3F98B9C0EDD4 wds:Q58193377-F5312D2F-255E-4E04-8F4D-DC7B7AE38CF1
author	Osami Sakata Kazumi Kato Takayuki Watanabe Muneyasu Suzuki
title	wds:Q58193377-92B02785-0CB0-4252-9057-EBD3E9A35668
title	Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (en)
page(s)	wds:Q58193377-2EB5E0CB-8362-4C22-A677-6BC085F6B587
page(s)	082901
instance of	wds:Q58193377-AB527591-4EAD-46C6-8D1D-2299CD0F038B
instance of	scholarly article
main subject	wds:Q58193377-6A0CD2EA-70AA-4913-8BA0-0428767C6ADB
main subject	wd:Q942
published in	wds:Q58193377-9F1E987B-99B5-43F1-AAA1-81130624EBD3
published in	Applied Physics Letters
issue	wds:Q58193377-7FDDB0DC-161E-4489-878C-9E19CB4BD01C
volume	wds:Q58193377-FAF3A826-B5BC-4B05-BA41-CBEBBCC2B49B
issue	8
volume	89
DOI	wds:Q58193377-2F1536E1-A1F6-4965-B239-E087AE817EEA
DOI	http://dx.doi.org/10.1063/1.2336626
DOI	10.1063/1.2336626
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q58193377
is cites work of	Two-dimensional dielectric nanosheets: novel nanoelectronics from nanocrystal building blocks Application of synchrotron-based reciprocal-space mapping at a fixed angular position to identification of crystal symmetry of Bi4Ti3O12epitaxial thin films
is cites work of	wds:Q58193201-C9A573ED-2C84-4FDB-B82C-ED0CC3742A71 wds:Q37945521-A767EA66-8267-49BE-BCEA-CE2DCB3D083A

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