About: The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence Goto Sponge NotDistinct Permalink

An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

article by J. S. Rigden et al published January 1997 in Journal of Materials Research

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в січні 1997 (uk) article scientifique publié en 1997 (fr) im Jahr 1997 veröffentlichter wissenschaftlicher Artikel (de) article by J. S. Rigden et al published January 1997 in Journal of Materials Research (en)
publication date	wds:Q57777833-9669A0B2-0B6C-46CC-B584-0401BE9E7B33
publication date	1997-01-01 00:00:00Z (xsd:dateTime)
author name string	wds:Q57777833-057A8E3D-3EA6-41C6-A2F6-CEAB1B851BE8 wds:Q57777833-1CAAAC62-58BA-4379-BBA8-A18B96844880 wds:Q57777833-B1031825-796A-4D6B-9428-B181278510A7
author name string	G. Bushnell-Wye R. J. Newport J. S. Rigden
rdfs:label	The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (en) The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (nl)
skos:prefLabel	The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (en) The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (nl)
name	The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (en) The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (nl)
title	wds:Q57777833-520EB32A-A456-4512-A2BD-8FCB9AE2B9BB
title	The structural characterization of amorphous thin films and coatings in their as-deposited state using x-rays at shallow angles of incidence (en)
page(s)	wds:Q57777833-507BE887-A822-4425-9C43-AC277320A1D4
page(s)	264-276
instance of	wds:Q57777833-47C0D72F-5FBA-4B87-A146-79D97E007981
instance of	scholarly article
main subject	wds:Q57777833-7D550150-E1DE-4522-A9E3-C977C7534EA8
main subject	thin film
published in	wds:Q57777833-459A8610-2C3E-4F36-B67E-398B87B7AF33
published in	Journal of Materials Research
issue	wds:Q57777833-F984ACDD-06B5-4AED-BCD2-93B08C26A6E9
volume	wds:Q57777833-55A1598C-0715-4368-82C1-DF92D3806C22
issue	01
volume	12
DOI	wds:Q57777833-1DE2425A-A3D5-4914-8AE6-4B564D225370
DOI	http://dx.doi.org/10.1557/JMR.1997.0034
DOI	10.1557/JMR.1997.0034
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q57777833
is cites work of	On Structure and Properties of Amorphous Materials Density,sp3fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy Synthesis of Metastable Inorganic Solids with Extended Structures
is cites work of	wds:Q41607119-364F81FA-F4D0-40D5-8B45-532B3A683124 wds:Q94454176-60E145E4-B8D5-4C9E-9C15-BCE371A34FBF wds:Q59197541-739A760A-AABF-450D-88BF-EFA4AB7B4DFE

Faceted Search & Find service v1.16.117 as of May 05 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3239 as of May 5 2024, on Linux (x86_64-centos_6-linux-gnu), Single-Server Edition (378 GB total memory, 180 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2025 OpenLink Software