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Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
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description
wetenschappelijk artikel
(nl)
наукова стаття, опублікована в жовтні 2013
(uk)
article scientifique publié en 2013
(fr)
im Oktober 2013 veröffentlichter wissenschaftlicher Artikel
(de)
publication date
wds:Q57774867-EB15F316-D456-486B-BF0C-29944096EBBD
publication date
2013-10-14 00:00:00Z
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language of work or name
wds:Q57774867-D88131CB-D0EC-40B3-B0E8-069FA580750E
language of work or name
English
cites work
wds:Q57774867-17B61147-873B-4D0D-AFF6-263211BE3EB1
wds:Q57774867-2122D8E6-736C-4E22-9591-E225DE26CBC9
wds:Q57774867-86577F52-73B8-4DFD-ABBF-DB560269727F
wds:Q57774867-9C01DA8D-2875-45B3-906C-12A024C2DC4D
wds:Q57774867-C0A1E6B3-28CF-417F-B302-C06D6A3079D1
wds:Q57774867-DC623CE2-7F51-45AF-A59F-57A6C7073ACC
cites work
Detailed Balance Limit of Efficiency of p‐n Junction Solar Cells
19·9%-efficient ZnO/CdS/CuInGaSe2solar cell with 81·2% fill factor
Fabrication of wide-gap Cu(In1−xGax)Se2 thin film solar cells: a study on the correlation of cell performance with highly resistive i-ZnO layer thickness
CIGS absorbers and processes
The influence of buffer layer on the transient behavior of thin film chalcopyrite devices
Temperature dependence of photocapacitance spectrum of CIGS thin-film solar cell
author name string
wds:Q57774867-0426B5CC-2F61-420F-96AF-33D394799595
wds:Q57774867-42313388-E92D-4744-AD5A-A55A37446485
wds:Q57774867-7E3E8C17-CC07-4340-A8D9-A2E3BF454EBB
wds:Q57774867-95D68A9A-CF07-41DD-9248-E93C957B01A4
wds:Q57774867-95E9D306-2314-481B-9E92-271E99FAD2DF
wds:Q57774867-BCD044F3-E0D7-4023-9DFF-36F3B4016DA1
wds:Q57774867-C1EA2A91-9D97-42A8-B78E-23A321AF0D9E
author name string
Amit Gupta
Xiaobo Hu
Akimasa Yamada
Katsuhiro Akimoto
Shigeru Niki
Shogo Ishizuka
Takeaki Sakurai
rdfs:label
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
(en)
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
(nl)
skos:prefLabel
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
(en)
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
(nl)
name
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
(en)
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
(nl)
author
wds:Q57774867-3371430F-68FF-4AE0-BCB7-1B5A44D86E0C
author
Shigeru Niki
title
wds:Q57774867-BCFC8497-2F7B-467E-A65C-E99699233799
title
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy
(en)
page(s)
wds:Q57774867-6C520706-FB15-43BE-B969-35FCF6D6C4BB
page(s)
163905
instance of
wds:Q57774867-CD1C8084-A669-4C71-8ACA-E117FD164272
instance of
scholarly article
main subject
wds:Q57774867-B6910877-73D3-4273-AB55-707BCB0FC0F1
main subject
thin film
published in
wds:Q57774867-E0DAE91F-2F7B-4B0C-8E9C-D4467102A257
published in
Applied Physics Letters
issue
wds:Q57774867-DEB45696-D620-4B12-A464-172D37CFD405
volume
wds:Q57774867-4DB3AB20-281C-4659-ACE3-1A80A76DB02A
issue
16
volume
103
DOI
wds:Q57774867-999A17E5-3D55-43C7-89F2-A1C92B2AC1EF
DOI
http://dx.doi.org/10.1063/1.4826144
DOI
10.1063/1.4826144
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about
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https://www.wikidata.org/wiki/Special:EntityData/Q57774867
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cites work
of
Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by a steady-state photocapacitance method
is
cites work
of
wds:Q57774848-3F26D477-0DE1-4022-886B-0FA82B3B7987
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