About: Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

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article by Xiaojing Huang et al published 10 July 2017 in Applied Physics Letters

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в липні 2017 (uk) im Juli 2017 veröffentlichter wissenschaftlicher Artikel (de) article by Xiaojing Huang et al published 10 July 2017 in Applied Physics Letters (en)
publication date	wds:Q57530165-959EABAF-88E2-4370-B47D-6F41B2632E6A
publication date	2017-07-10 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q57530165-CAE466BD-BF26-4169-915A-AB089CD052A8
language of work or name	English
cites work	wds:Q57530165-0630BE34-356A-4256-A22A-D29F32DB4709 wds:Q57530165-16D7FF04-FB61-43DF-9364-56DDA3524B2C wds:Q57530165-18BA5E98-2226-4423-8BC4-9D0335668582 wds:Q57530165-20BDD69D-1D91-4434-98C0-554F885513EA wds:Q57530165-2AB0A93E-E7AC-44C9-8998-F64962678BCD wds:Q57530165-2E54EB6F-9E97-4147-880D-1AD1B432A732 wds:Q57530165-35A3EA0D-A6A4-41D0-B537-8AFF6308CF1E wds:Q57530165-3751F833-5A1A-4FDD-9F1C-2AAB46A78FD9 wds:Q57530165-38CAA7D6-F3E2-468A-8B6D-EA85DB803256 wds:Q57530165-3ABDDEC5-2916-4AC0-A7E2-350E3FA63BC0 wds:Q57530165-4606E18C-DEAC-4608-8CA9-9D8720D07E93 wds:Q57530165-480587B9-DC97-40A7-8193-A5504F0AE6A7 wds:Q57530165-55CBB0AF-2ECA-4C8F-A0C0-8920F2542507 wds:Q57530165-5E29F851-06BD-4753-A230-2BE394CD79AB wds:Q57530165-5F829B1A-F80C-4BF9-8888-E3AA335C1FE0 wds:Q57530165-6AC09A5B-6424-4097-B7C0-A43B1DE92CF6 wds:Q57530165-6F92940F-A5AB-4E66-BE01-95453A2DC724 wds:Q57530165-7A7E8547-E42B-478F-A3D2-BFA3A5B33BF7 wds:Q57530165-7D097661-41C6-400D-A4FC-DD13BE4AC9AA wds:Q57530165-881328BA-67BB-4F96-B2F5-85D123AAEB32 wds:Q57530165-8C6AD2B6-14CA-4116-A02A-C8DC3DCE631E wds:Q57530165-915A730D-A240-4953-9C96-06A9172F85A7 wds:Q57530165-AA0B8CC7-CA67-41F9-960A-9C6AFEB9F413 wds:Q57530165-C4BC14B6-0651-4BC5-B560-F7FA1F8BAD39 wds:Q57530165-CC3608EB-614A-4FDB-9CFE-470CB76D312C wds:Q57530165-CEB4866E-73CB-438C-B4B8-D66E589E83AE wds:Q57530165-D6FDBA63-7BF1-4A44-80F8-0A862EC3D187 wds:Q57530165-D731AA5D-B580-44A0-B3E5-DC8A19228CF7 wds:Q57530165-F1C27076-1E77-415F-8823-C37CF4428EAD
cites work	High-resolution scanning x-ray diffraction microscopy Breaking the 10 nm barrier in hard-X-ray focusing Ultra-high aspect ratio high-resolution nanofabrication for hard X-ray diffractive optics The Bionanoprobe: hard X-ray fluorescence nanoprobe with cryogenic capabilities. High numerical aperture multilayer Laue lenses. Phase retrieval with transverse translation diversity: a nonlinear optimization approach. Fly-scan ptychography Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging. Continuous scanning mode for ptychography. Reconstructing state mixtures from diffraction measurements Simultaneous cryo X-ray ptychographic and fluorescence microscopy of green algae. Soft X-ray spectromicroscopy using ptychography with randomly phased illumination. Hard-x-ray lensless imaging of extended objects. An improved ptychographical phase retrieval algorithm for diffractive imaging. Chemical composition mapping with nanometre resolution by soft X-ray microscopy Ptychographic coherent diffractive imaging of weakly scattering specimens An instrument for 3D x-ray nano-imaging. Pushing the limits: an instrument for hard X-ray imaging below 20 nm. Optimization of overlap uniformness for ptychography Probe retrieval in ptychographic coherent diffractive imaging 11 nm hard X-ray focus from a large-aperture multilayer Laue lens Influence of the overlap parameter on the convergence of the ptychographical iterative engine X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning Scanning transmission X-ray microscopy with a fast framing pixel detector Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution A study of grid artifacts formation and elimination in computed radiographic images Elementary signals in ptychography A new stationary gridline artifact suppression method based on the 2D discrete wavelet transform Nm-scale spatial resolution X-ray imaging with MLL nanofocusing optics: Instrumentational requirements and challenges
author name string	wds:Q57530165-46012A2B-57FF-40D2-BC00-6C0DB9AB0845 wds:Q57530165-73D0CF96-9720-4FA7-841F-D869FD9F5191 wds:Q57530165-B117925A-3226-494D-A0BF-BE080482B642 wds:Q57530165-CF85DA67-2F2A-48D1-BF58-F7F61D1CACC5
author name string	Mingyuan Ge Hande Öztürk Yong S. Chu Ian K. Robinson
rdfs:label	Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy (en) Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy (nl)
skos:prefLabel	Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy (en) Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy (nl)
name	Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy (en) Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy (nl)
author	wds:Q57530165-085EDEC7-C41D-483B-A32F-095A5DD750B0 wds:Q57530165-468C9C20-5E94-421D-864A-011DA3BB8240 wds:Q57530165-5BF8D644-6682-4F60-A231-4F520613173F
author	Hanfei Yan Evgeny Nazaretski Xiaojing Huang
title	wds:Q57530165-7B6542D5-0921-40BC-80D9-35545AA4BB03
title	Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy (en)
page(s)	wds:Q57530165-E4434D9C-2D8E-41F4-A0EE-0C337F16C83D
page(s)	023103
instance of	wds:Q57530165-B98E0A61-37AE-44FA-9CFB-BEA46B33619C
instance of	scholarly article
published in	wds:Q57530165-79E5D392-431C-49D9-BB41-EAB8639F80F0
published in	Applied Physics Letters
issue	wds:Q57530165-B7BA7414-4BF2-4CB3-B0CF-217510D87D0B
volume	wds:Q57530165-002B2CBB-2486-4383-B4F0-B13A2630786A
issue	2
volume	111
DOI	wds:Q57530165-21DA5942-167C-4FFC-BFE1-5FC06C9130AF

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