About: Capillary forces in tapping mode atomic force microscopy

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scholarly article in Physical Review B, vol. 66 no. 15, October 2002

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в жовтні 2002 (uk) im Oktober 2002 veröffentlichter wissenschaftlicher Artikel (de) article scientifique publié en octobre 2002 (fr) scholarly article in Physical Review B, vol. 66 no. 15, October 2002 (en)
publication date	wds:Q57406883-342834A8-1A11-4DE1-A56E-52A1BB1A515D
publication date	2002-10-31 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q57406883-CCDC50D1-77E0-4C62-A88C-23BD0DC7A642
language of work or name	English
cites work	wds:Q57406883-65BDFEDA-E877-4230-BD2C-A43529B98271 wds:Q57406883-87751960-2644-4946-B848-C80002AABA13 wds:Q57406883-9FD1AB4D-B8D5-42F8-B870-E012F4F83B74 wds:Q57406883-BE17A307-B7A9-4CDE-B002-EF6F5951925B wds:Q57406883-C6F20045-E4E1-4B7D-B589-4AA75C44C01D wds:Q57406883-D2A3BC9D-E8B3-4D37-974C-761499B4DB4E wds:Q57406883-E016B0ED-2558-4F7A-BD41-4DB6EDE32BD3 wds:Q57406883-E5391F8B-9C1F-4CEF-96CD-8CED47BA7CB2 wds:Q57406883-E61BBC73-8134-42D8-91A2-D67BC9288690
cites work	Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy Surface biology of DNA by atomic force microscopy Amplitude curves and operating regimes in dynamic atomic force microscopy Tapping Mode Atomic Force Microscopy on Polymers: Where Is the True Sample Surface? Three-phase contact line energetics from nanoscale liquid surface topographies Large-q asymptotics of the random-bond potts model Observation of Liquid Neck Formation with Scanning Force Microscopy Techniques Adsorption of Water on Solid Surfaces Studied by Scanning Force Microscopy Investigating the Interfacial Properties of Single-Liquid Nanodroplets by Atomic Force Microscopy
author name string	wds:Q57406883-35BA5649-E211-4B5C-B36E-275096CE6431
author name string	L. Zitzler
rdfs:label	Capillary forces in tapping mode atomic force microscopy (en) Capillary forces in tapping mode atomic force microscopy (nl)
skos:prefLabel	Capillary forces in tapping mode atomic force microscopy (en) Capillary forces in tapping mode atomic force microscopy (nl)
name	Capillary forces in tapping mode atomic force microscopy (en) Capillary forces in tapping mode atomic force microscopy (nl)
author	wds:Q57406883-776F14DA-AC81-4A86-807B-9D4B4170EAA6 wds:Q57406883-ea2a6e39-4c84-516d-f161-2abe78e4d669
author	Stephan Herminghaus Frieder Mugele
title	wds:Q57406883-0CBECB82-CC2E-45E5-ACA0-8BC23CDB5E6B
title	Capillary forces in tapping mode atomic force microscopy (en)
instance of	wds:Q57406883-7BBC7847-7F4C-4138-AFEA-B36F9ACB44A0
instance of	scholarly article
main subject	wds:Q57406883-23B7B795-1969-4D44-8FBD-66756A5AABD7
main subject	microscopy
published in	wds:Q57406883-5B82B96D-734D-49FA-856A-90DAECCF5F0B
published in	Physical Review B
issue	wds:Q57406883-1A6E247D-D444-4C19-884D-C2910A766B64
volume	wds:Q57406883-D8E7CB43-E4C2-459B-B5A2-1472A31B1ACE
issue	15
volume	66
DOI	wds:Q57406883-98389FD7-70CF-4C49-9DB7-C759764AF2F0
DOI	http://dx.doi.org/10.1103/PHYSREVB.66.155436
DOI	10.1103/PHYSREVB.66.155436
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q57406883
is cites work of	Theory of Q-Controlled dynamic force microscopy in air Energy Dissipation due to Capillary Interactions: Hydrophobicity Maps in Force Microscopy Capillary and van der Waals interactions on CaF2 crystals from amplitude modulation AFM force reconstruction profiles under ambient conditions An atomic force microscope tip designed to measure time-varying nanomechanical forces VEDA: a web-based virtual environment for dynamic atomic force microscopy. Scanning probe acceleration microscopy (SPAM) in fluids: mapping mechanical properties of surfaces at the nanoscale Atomic force microscopy of DNA at high humidity: irreversible conformational switching of supercoiled molecules. Water-mediated height artifacts in dynamic atomic force microscopy. A method to provide rapid in situ determination of tip radius in dynamic atomic force microscopy. Nonlinear Dynamics and Chaos of Microcantilever-Based TM-AFMs with Squeeze Film Damping Effects Formation and rupture of capillary bridges in atomic scale friction. Contrast inversion in non-contact Dynamic Scanning Force Microscopy: what is high and what is low? Imaging Water Thin Films in Ambient Conditions Using Atomic Force Microscopy The effects of adsorbed water layers on the apparent height of nanostructures in ambient amplitude modulation atomic force microscopy. Imaging the substructure of antibodies with tapping-mode AFM in air: the importance of a water layer on mica The substructure of immunoglobulin G resolved to 25 kDa using amplitude modulation AFM in air. Investigation of temperature induced mechanical changes in supported bilayers by variants of tapping mode atomic force microscopy High resolution non-contact AFM imaging of liquids condensed onto chemically nanopatterned surfaces. Dynamics of a thin liquid film interacting with an oscillating nano-probe. Elucidation of the wettability of graphene through a multi-length-scale investigation approach High resolution mapping of oxygen reduction reaction kinetics at polycrystalline platinum electrodes Unstable amplitude and noisy image induced by tip contamination in dynamic force mode atomic force microscopy. Correlative infrared nanospectroscopic and nanomechanical imaging of block copolymer microdomains Single cycle and transient force measurements in dynamic atomic force microscopy Direct measurement of tapping force with a cantilever deflection force sensor Feedback-induced instability in tapping mode atomic force microscopy: theory and experiment Direct deformation study of AFM probe tips modified by hydrophobic alkylsilane self-assembled monolayers Force of adhesion on supersolvophobic surfaces: The role of capillary necks Advanced measurement and diagnosis of the effect on the underlayer roughness for industrial standard metrology Few-cycle Regime Atomic Force Microscopy The power laws of nanoscale forces under ambient conditions. Influence of humidity on tribo-electric charging and segregation in shaken granular media. Charging changes contact composition in binary sphere packings. Modeling of Pull-In Instability of Nano/Micromirrors Under the Combined Effect of Capillary and Casimir Forces Reduction in Step Height Variation and Correcting Contrast Inversion in Dynamic AFM of WS2 Monolayers. INFLUENCE OF VAN DER WAALS FORCE ON STATIC BEHAVIOR OF NANO/MICROMIRRORS UNDER CAPILLARY FORCE Unraveling capillary interaction and viscoelastic response in atomic force microscopy of hydrated collagen fibrils. Observer Design for Topography Estimation in Atomic Force Microscopy Using Neural and Fuzzy Networks Characterization of the static behavior of micromirrors under the effect of capillary force, an analytical approach Effects of temperature and humidity on atomic force microscopy dimensional measurement. Single-Carbon-Nanotube Manipulations and Devices Based on Macroscale Anthracene Flakes. Integrated tunneling sensor for nanoelectromechanical systems A coupled two degree of freedom pull-in model for micromirrors under capillary force
is cites work of	wds:Q33354908-1F27622A-321C-4A78-ADB8-6517407D133C

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