semiconductor
Attributes | Values |
---|---|
rdf:type | |
description |
|
rdfs:label |
|
skos:prefLabel |
|
name |
|
has effect | |
has effect | |
NIOSH Pocket Guide ID | |
time-weighted average exposure limit | |
NIOSH Pocket Guide ID |
|
time-weighted average exposure limit |
|
subclass of | |
subclass of | |
is about of | |
is of of | |
is has cause of | |
is has cause of |