About: Electron interferometry at a metal-semiconductor interface

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An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

scientific article published on 01 January 1992

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в січні 1992 (uk) article scientifique publié en 1992 (fr) im Januar 1992 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu en xineru de 1992 (ast) artikull shkencor i botuar më 01 janar 1992 (sq) scientific article published on 01 January 1992 (en)
publication date	wds:Q74515769-1E7A02C6-E635-41FA-A582-F13947FCD968
publication date	1992-01-01 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q74515769-1CF28DF0-B799-474B-8D78-35EF02A936A3
language of work or name	English
cites work	wds:Q74515769-094B2D32-D940-4AA2-935A-366B36081A38 wds:Q74515769-3C659899-0301-4452-9787-C516CA9ACABF wds:Q74515769-4878D7F1-6686-4AA8-8B5B-3644330931A2 wds:Q74515769-54209210-F893-4947-975A-E6128D42B626 wds:Q74515769-71019168-0C83-4846-BFD3-BB622D0AA0C9 wds:Q74515769-99A17FF2-C07D-4666-AD1E-1454D55031F5 wds:Q74515769-FBD0282B-7B01-4986-86FA-90B7640DCEE2
cites work	Real-space observation of surface states on Si(111)7 x 7 with the tunneling microscope Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy Electron interferometry at a heterojunction interface Fabry-Pérot transmission resonances in tunneling microscopy Electron transmission through silicon stacking faults Electron interferometry at crystal surfaces Electron transmission through NiSi2-Si interfaces
author name string	wds:Q74515769-593D2D06-ED5B-4450-80AF-8CFD31965A42 wds:Q74515769-60482DC9-7757-485F-9AF4-971AAC864AB9
author name string	Greene WJ Kubby JA
rdfs:label	Electron interferometry at a metal-semiconductor interface (en) Electron interferometry at a metal-semiconductor interface (nl) Electron interferometry at a metal-semiconductor interface (sq)
skos:prefLabel	Electron interferometry at a metal-semiconductor interface (en) Electron interferometry at a metal-semiconductor interface (nl) Electron interferometry at a metal-semiconductor interface (sq)
name	Electron interferometry at a metal-semiconductor interface (en) Electron interferometry at a metal-semiconductor interface (nl) Electron interferometry at a metal-semiconductor interface (sq)
title	wds:Q74515769-8565F992-CDA5-4F83-962E-74B53C43BE91
title	Electron interferometry at a metal-semiconductor interface (en)
page(s)	wds:Q74515769-72124A76-E543-4F7F-A4E0-BC7D0C0805E3
page(s)	329-332
instance of	wds:Q74515769-DDCACDCE-C0B4-43E6-B105-FBE07CBB5BC7
instance of	scholarly article
PubMed ID	wds:Q74515769-7A79ADDE-0638-4FB3-9665-6EC749458525
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/10045864
PubMed ID	10045864
published in	wds:Q74515769-03FC0701-9822-4ECB-B9F6-697349605945
published in	Physical Review Letters
issue	wds:Q74515769-5526FD2A-DDBA-447A-8144-D4B88E2F2540
volume	wds:Q74515769-766E0A19-263F-45EC-AB8C-2D39F809B5C5
issue	3
volume	68
DOI	wds:Q74515769-65F5FC87-EAA7-4DAE-8ECA-313EB54BEEBF
DOI	http://dx.doi.org/10.1103/PHYSREVLETT.68.329
DOI	10.1103/PHYSREVLETT.68.329
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q74515769
is cites work of	Imaging defect formation in the template growth of NiSi2/Si(111): An application of quantum size microscopy. Particle in a variable-size box: The influence of the tip in thin-film electron interferometry. Scanning-tunneling-microscopy investigation of the quantum-size effect in epitaxial CoSi2/Si(111).
is cites work of	wds:Q47389352-25C92B7E-5D5B-4FB6-80C7-38B22D083D5E wds:Q47386314-3B0BB763-9D5D-45B1-AB21-07AC55D60CE8 wds:Q47370755-13E24920-577E-4921-9E22-18C7925DB3D6

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