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scientific article published on 11 October 2011

AttributesValues
rdf:type
description
  • wetenschappelijk artikel (nl)
  • наукова стаття, опублікована в жовтні 2011 (uk)
  • im Oktober 2011 veröffentlichter wissenschaftlicher Artikel (de)
  • scientific article published on 11 October 2011 (en)
  • 2011 թվականի հոկտեմբերի 11-ին հրատարակված գիտական հոդված (hy)
  • artículu científicu espublizáu n'ochobre de 2011 (ast)
publication date
publication date
cites work
cites work
author name string
author name string
  • Chia-Hao Chen
  • Hung-Wei Shiu
  • Yuan-Ron Ma
  • Shun-Yu Gao
  • Yu-Rong Lin
  • Yung Liou
  • Chia-Er Hsu
  • Shun-Rong Cheng
rdfs:label
  • Scanning photoemission spectromicroscopic study of 4-nm ultrathin SiO(3.4) protrusions probe-induced on the native SiO(2) layer (en)
  • Scanning photoemission spectromicroscopic study of 4-nm ultrathin SiO(3.4) protrusions probe-induced on the native SiO(2) layer (nl)
skos:prefLabel
  • Scanning photoemission spectromicroscopic study of 4-nm ultrathin SiO(3.4) protrusions probe-induced on the native SiO(2) layer (en)
  • Scanning photoemission spectromicroscopic study of 4-nm ultrathin SiO(3.4) protrusions probe-induced on the native SiO(2) layer (nl)
name
  • Scanning photoemission spectromicroscopic study of 4-nm ultrathin SiO(3.4) protrusions probe-induced on the native SiO(2) layer (en)
  • Scanning photoemission spectromicroscopic study of 4-nm ultrathin SiO(3.4) protrusions probe-induced on the native SiO(2) layer (nl)
author
author
title
title
  • Scanning photoemission spectromicroscopic study of 4-nm ultrathin SiO(3.4) protrusions probe-induced on the native SiO(2) layer (en)
page(s)
page(s)
  • 944-949
instance of
instance of
PubMed ID
PubMed ID
PubMed ID
  • 22008643
published in
published in
issue
volume
issue
  • 6
volume
  • 17
DOI
DOI
DOI
  • 10.1017/S1431927611011901
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