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description
| - wetenschappelijk artikel (nl)
- наукова стаття, опублікована в січні 1989 (uk)
- im Januar 1989 veröffentlichter wissenschaftlicher Artikel (de)
- artículu científicu espublizáu en xineru de 1989 (ast)
- artikull shkencor i botuar më 01 janar 1989 (sq)
- scientific article published on 01 January 1989 (en)
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| - Becker RS
- Klitsner T
- Vickers JS
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rdfs:label
| - Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (en)
- Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (nl)
- Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (sq)
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skos:prefLabel
| - Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (en)
- Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (nl)
- Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (sq)
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name
| - Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (en)
- Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (nl)
- Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (sq)
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| - Dimer-adatom-stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2 x 8) to Si(111)-(2 x 2), -(5 x 5), -(7 x 7), and -(9 x 9) with scanning tunneling microscopy (en)
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