About: Roughening instability and evolution of the Ge(001) surface during ion sputtering

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About: Roughening instability and evolution of the Ge(001) surface during ion sputtering Goto Sponge Distinct Permalink

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scientific article published on 01 May 1994

Attributes	Values
rdf:type	Item
description	wetenschappelijk artikel (nl) наукова стаття, опублікована в травні 1994 (uk) article scientifique publié en 1994 (fr) im Mai 1994 veröffentlichter wissenschaftlicher Artikel (de) artículu científicu espublizáu en mayu de 1994 (ast) scientific article published on 01 May 1994 (en)
publication date	wds:Q74547348-3C9C037B-B9B3-46FF-9144-3F739C88DA90
publication date	1994-05-01 00:00:00Z (xsd:dateTime)
language of work or name	wds:Q74547348-3A03D26E-9E89-4144-ABEC-6EAB507943A2
language of work or name	English
cites work	wds:Q74547348-06D400AD-968F-4993-83D6-862E4EC00873 wds:Q74547348-270A72BB-DD86-4CDB-8F42-434EE1220467 wds:Q74547348-7903E926-3746-4620-8D65-EDD8BAAFE122 wds:Q74547348-AD1168FB-3B73-43EA-9B5E-8F49DE3EC564 wds:Q74547348-B6E2C08A-2B98-45D3-8DB2-5BB93E3AB350 wds:Q74547348-BA6CC566-D3D7-42D2-9358-64DCBBFD9BFC wds:Q74547348-EAC986B8-F58D-4708-9D58-B511D0BD0E6C
cites work	Strain relaxation during the initial stages of growth in Ge/Si(001). Dynamic scaling of growing interfaces. Scaling of the active zone in the Eden process on percolation networks and the ballistic deposition model Activation energy for surface diffusion of Si on Si(001): A scanning-tunneling-microscopy study X-ray reflectivity and scanning-tunneling-microscope study of kinetic roughening of sputter-deposited gold films during growth Correlation from randomness: quantitative analysis of ion-etched graphite surfaces using the scanning tunneling microscope Experimental study of smoothing kinetics on a rough surface
author name string	wds:Q74547348-433C8625-0BB1-40B0-B595-EE45E48D992A wds:Q74547348-64AF2F45-3174-4A39-BF5F-A68D26D1AF41 wds:Q74547348-779D4921-7E95-49CA-ABB4-4554E6038C1B wds:Q74547348-7CEBB6BB-A172-4CEF-9894-972853C67265 wds:Q74547348-B147EFD3-6D92-4148-9CB2-641C1A3DC991
author name string	Chason E Howard AJ Kellerman BK Mayer TM McIlroy DT
rdfs:label	Roughening instability and evolution of the Ge (nl) Roughening instability and evolution of the Ge(001) surface during ion sputtering (en)
skos:prefLabel	Roughening instability and evolution of the Ge (nl) Roughening instability and evolution of the Ge(001) surface during ion sputtering (en)
name	Roughening instability and evolution of the Ge (nl) Roughening instability and evolution of the Ge(001) surface during ion sputtering (en)
title	wds:Q74547348-FB867AEE-4B6B-4D4F-B161-32476C1841C4
title	Roughening instability and evolution of the Ge(001) surface during ion sputtering (en)
page(s)	wds:Q74547348-0B9C7AE7-A687-44C9-BF82-37D97B98D0D0
page(s)	3040-3043
instance of	wds:Q74547348-9C361C2A-3230-45E0-84C4-76948FFB46A1
instance of	scholarly article
PubMed ID	wds:Q74547348-3742C43C-DE71-44CC-B382-FEBB10FA9977
PubMed ID	http://rdf.ncbi.nlm.nih.gov/pubchem/reference/10056052
PubMed ID	10056052
published in	wds:Q74547348-46493B03-C355-455A-86D1-E9B36AAC28C7
published in	Physical Review Letters
issue	wds:Q74547348-4C24607A-4739-4E7D-A686-6E6A3232F32E
volume	wds:Q74547348-B1386F2A-F708-4D8C-9FE0-D4415DFD45D9
issue	19
volume	72
DOI	wds:Q74547348-77D7D250-662F-4B30-B738-6E78CCA9BD01
DOI	http://dx.doi.org/10.1103/PHYSREVLETT.72.3040
DOI	10.1103/PHYSREVLETT.72.3040
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q74547348
is cites work of	Ion-Induced Nanoscale Ripple Patterns on Si Surfaces: Theory and Experiment. Transition from ripples to faceted structures under low-energy argon ion bombardment of silicon: understanding the role of shadowing and sputtering State selection in the noisy stabilized Kuramoto-Sivashinsky equation. Anisotropic Kuramoto-Sivashinsky equation for surface growth and erosion. Morphology of ion-sputtered surfaces Ion etching of Ag(110) studied by X-ray and STM Characterization of ion-irradiation-induced nanodot structures on InP surfaces by atom probe tomography Self-organizing nanodot structures on InP surfaces evolving under low-energy ion irradiation: analysis of morphology and composition Ion-Beam-Directed Self-Ordering of Ga Nanodroplets on GaAs Surfaces Possible origin for the experimental scarcity of KPZ scaling in non-conserved surface growth Investigations of ripple pattern formation on Germanium surfaces using 100-keV Ar(+) ions. Evolution of surface morphology of ion sputtered GaAs() Morphological symmetry breaking during epitaxial growth at grazing incidence Surface morphology of Ge(001) during etching by low-energy ions Directional mass transport by momentum transfer from ion beam to solid
is cites work of	wds:Q60182485-860E4E2C-28F2-49D1-BE74-5FD95540F177 wds:Q35633448-E270292F-7635-47D7-840A-A1B715FE7382 wds:Q36510820-2C6BE003-2E77-4D39-A030-31B80AF14693 wds:Q57741828-3BD480B5-53AD-4119-BA51-E875BB3AFE9C wds:Q39220579-465396DE-D3E6-4C0A-938F-E9570D9F8D33 wds:Q41904318-7E2E6128-537C-4130-B3DE-88A6A897E873 wds:Q42129044-98F3381A-E7DB-4DF6-82D6-FD9C83DEF956 wds:Q60082278-DD7A9DA4-90CE-4C1D-9F6F-682E7940B267 wds:Q73041768-2E8BA7BD-5469-4550-95DA-CFF39FD7811F wds:Q78140326-F58EBD8F-FA86-490F-966C-C13329BAB242 wds:Q52323539-9B61FF66-7373-469C-B864-789531EA9617 wds:Q51657224-E40409F4-38DA-42C2-B5F7-E0D5EFC52848 wds:Q43116751-2554CC44-E659-4F05-B234-1DCA99B541C2 wds:Q74561013-E7CFB6FF-805E-4B94-A15E-6A5C0DB21A15 wds:Q57741822-F41DC14A-C78D-4577-90EB-4F237CDAD8A6

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