About: Thilo Glatzel

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An Entity of Type : wikibase:Item, within Data Space : wikidata.demo.openlinksw.com associated with source document(s)

researcher

Attributes	Values
rdf:type	Item
description	researcher (en) 연구원 (ko) ricercatore (it) গবেষক (bn) 研究者 (ja) ഗവേഷകൻ (ml) araştırmacı (tr) wetenschapper (nl) дослідник (uk) эрдэмтэн (mn) 研究者 (zh) հետազոտող (hy) hulumtues (sq)
rdfs:label	Thilo Glatzel (en) Thilo Glatzel (es) Thilo Glatzel (nl) Thilo Glatzel (sl) Thilo Glatzel (ast)
skos:prefLabel	Thilo Glatzel (en) Thilo Glatzel (es) Thilo Glatzel (nl) Thilo Glatzel (sl) Thilo Glatzel (ast)
name	Thilo Glatzel (en) Thilo Glatzel (es) Thilo Glatzel (nl) Thilo Glatzel (sl) Thilo Glatzel (ast)
Scopus author ID	wds:Q44333483-DEAF6059-7087-4DFA-955C-12DFA8C6CBFE
Scopus author ID	6603050413
given name	wds:Q44333483-6E95A04E-1129-451C-B73A-AB9C76FC7C74
given name	Thilo
instance of	wds:Q44333483-87F72B1B-A65C-48C1-9BA2-1C5E7C9B1EB5
instance of	Homo sapiens
occupation	wds:Q44333483-D67D055E-0621-42A9-80CA-4D8D89A053D9
employer	wds:Q44333483-479F85CB-9C9F-4E55-B848-B0F492950CC2 wds:Q44333483-48A9292A-CF47-47C2-8090-C9223362F69E wds:Q44333483-73829B6A-8B7E-4FF9-B59C-EAA805BB385C
sex or gender	wds:Q44333483-49C4803D-55DF-4F65-BAE1-06782DC7CA5E
ISNI	wds:Q44333483-BE56A2BA-BE6C-47D5-9D42-6C6EC2F92812
VIAF ID	wds:Q44333483-700EA32E-0AA1-4BB9-ADF7-C59AA1D8B090
GND ID	wds:Q44333483-c4d3621a-2677-4926-a076-fa9408a5de07
Library of Congress authority ID	wds:Q44333483-52862B04-E4B2-4A28-AE59-3961CEB5D18E
IdRef ID	wds:Q44333483-04733355-e45b-4d1d-9fcd-6d0bdaebba89
educated at	wds:Q44333483-6E7C5877-8526-4346-8B1D-CC4ABB3CF13B
family name	wds:Q44333483-33F5C5C3-AEA8-4CFF-8D41-1C4D674E373D
WorldCat Identities ID (superseded)	wds:Q44333483-70AFF1C4-D091-484B-AA36-78FC6CF1538E
National Library of Israel J9U ID	wds:Q44333483-03262D8D-6676-4F00-887E-CDC421322886
VIAF ID	http://viaf.org/viaf/210854815
GND ID	https://d-nb.info/gnd/128801050
Library of Congress authority ID	http://id.loc.gov/authorities/names/nb2011030621
IdRef ID	http://www.idref.fr/158602447/id
occupation	researcher
employer	University of Yamanashi University of Basel Helmholtz-Zentrum Berlin
sex or gender	male
ISNI	0000000433592436
VIAF ID	210854815
GND ID	128801050
Library of Congress authority ID	nb2011030621
IdRef ID	158602447
educated at	University of Basel
family name	Glatzel
WorldCat Identities ID (superseded)	lccn-nb2011030621
National Library of Israel J9U ID	987007318897805171
ORCID iD	wds:Q44333483-D8666013-BF56-4A3B-813E-B1A5DCABE583
ORCID iD	https://orcid.org/0000-0002-3533-4217
ORCID iD	0000-0002-3533-4217
ResearcherID	wds:Q44333483-D6AA0B75-F43C-4566-BDCF-89315B00778B
Publons author ID	wds:Q44333483-3ff9b71d-c43b-451a-8d4e-604f716cef7c
ResearcherID	F-2639-2011
Publons author ID	2782660
SNSF person ID	wds:Q44333483-45E2991F-462D-4AB6-A8CA-F7DF861E4348
SNSF person ID	561310
is about of	https://www.wikidata.org/wiki/Special:EntityData/Q44333483
is author of	Using Scanning Electrochemical Microscopy to Examine Copper(I) Sensitizers for Dye-Sensitized Solar Cells Advanced atomic force microscopy techniques III. Single-Molecule Tribology: Force Microscopy Manipulation of a Porphyrin Derivative on a Copper Surface. Electrospray deposition of organic molecules on bulk insulator surfaces. Advanced atomic force microscopy techniques Advanced atomic force microscopy techniques II. Obtaining detailed structural information about supramolecular systems on surfaces by combining high-resolution force microscopy with ab initio calculations. Energy dissipation in dynamic force microscopy on KBr(001) correlated with atomic-scale adhesion phenomena Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes Atomic-Scale Mechanical Properties of Orientated C60 Molecules Revealed by Noncontact Atomic Force Microscopy Functionalized truxenes: adsorption and diffusion of single molecules on the KBr(001) surface. Nanoscale engineering of molecular porphyrin wires on insulating surfaces Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis Novel Probes for Molecular Electronics Molecular Assemblies on Insulating Ultrathin Films Analyzed by NC-AFM and KPFM Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy Interplay of the tip–sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field Three-dimensional dynamic force spectroscopy measurements on KBr(001): atomic deformations at small tip–sample separations Atomic scale Kelvin probe force microscopy studies of the surface potential variations on the TiO2(110) surface Energy Loss Triggered by Atomic-Scale Lateral Force Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals Ordering of Zn-centered porphyrin and phthalocyanine on TiO2(011): STM studies

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