About: IEEE Transactions on Instrumentation and Measurement

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journal

Attributes	Values
rdf:type	Item
description	journal (en) revista científica (es) vědecký časopis (cs) ساینَسی رِسالہٕ (ks) مجلة (ar) revue scientifique (fr) rivista scientifica (it) науковий журнал (uk) wissenschaftliche Fachzeitschrift (de) wetenschappelijk tijdschrift van Institute of Electrical and Electronics Engineers (nl)
language of work or name	wds:Q15751154-417926E8-3FF5-4E7B-B3E0-350182EC6282
language of work or name	English
OpenCitations bibliographic resource ID	wds:Q15751154-1C17A3CB-FCD2-4261-A9CD-23458BCC9FAF
Scilit journal ID	wds:Q15751154-60F642B9-5964-49DF-B47B-776340EDD009
Crossref journal ID	wds:Q15751154-3473DF47-0452-4FDD-A93E-E0E971B10C67
OpenCitations bibliographic resource ID	https://w3id.org/oc/corpus/br/166234
OpenCitations bibliographic resource ID	166234
Scilit journal ID	107852
Crossref journal ID	5365
rdfs:label	IEEE Transactions on Instrumentation and Measurement (da) IEEE Transactions on Instrumentation and Measurement (de) IEEE Transactions on Instrumentation and Measurement (en) IEEE Transactions on Instrumentation and Measurement (es) IEEE Transactions on Instrumentation and Measurement (fi) IEEE Transactions on Instrumentation and Measurement (fo) IEEE Transactions on Instrumentation and Measurement (fr) IEEE Transactions on Instrumentation and Measurement (is) IEEE Transactions on Instrumentation and Measurement (it) IEEE Transactions on Instrumentation and Measurement (kl) IEEE Transactions on Instrumentation and Measurement (nb) IEEE Transactions on Instrumentation and Measurement (nl) IEEE Transactions on Instrumentation and Measurement (nn) IEEE Transactions on Instrumentation and Measurement (sv) IEEE Transactions on Instrumentation and Measurement (ast)
skos:prefLabel	IEEE Transactions on Instrumentation and Measurement (da) IEEE Transactions on Instrumentation and Measurement (de) IEEE Transactions on Instrumentation and Measurement (en) IEEE Transactions on Instrumentation and Measurement (es) IEEE Transactions on Instrumentation and Measurement (fi) IEEE Transactions on Instrumentation and Measurement (fo) IEEE Transactions on Instrumentation and Measurement (fr) IEEE Transactions on Instrumentation and Measurement (is) IEEE Transactions on Instrumentation and Measurement (it) IEEE Transactions on Instrumentation and Measurement (kl) IEEE Transactions on Instrumentation and Measurement (nb) IEEE Transactions on Instrumentation and Measurement (nl) IEEE Transactions on Instrumentation and Measurement (nn) IEEE Transactions on Instrumentation and Measurement (sv) IEEE Transactions on Instrumentation and Measurement (ast)
name	IEEE Transactions on Instrumentation and Measurement (da) IEEE Transactions on Instrumentation and Measurement (de) IEEE Transactions on Instrumentation and Measurement (en) IEEE Transactions on Instrumentation and Measurement (es) IEEE Transactions on Instrumentation and Measurement (fi) IEEE Transactions on Instrumentation and Measurement (fo) IEEE Transactions on Instrumentation and Measurement (fr) IEEE Transactions on Instrumentation and Measurement (is) IEEE Transactions on Instrumentation and Measurement (it) IEEE Transactions on Instrumentation and Measurement (kl) IEEE Transactions on Instrumentation and Measurement (nb) IEEE Transactions on Instrumentation and Measurement (nl) IEEE Transactions on Instrumentation and Measurement (nn) IEEE Transactions on Instrumentation and Measurement (sv) IEEE Transactions on Instrumentation and Measurement (ast)
title	wds:Q15751154-3E9F4B3F-08CE-4F9E-BD45-1ABA9AFA4365
title	IEEE Transactions on Instrumentation and Measurement (en)
ERA Journal ID	wds:Q15751154-FD3F5ECE-C75E-4705-AFE8-D85A2539B296
Danish Bibliometri...h Indicator level	wds:Q15751154-1274D800-F18D-4192-B0CC-63AF27512ACA
Danish Bibliometri...tor (BFI) SNO/CNO	wds:Q15751154-270746CC-F92A-4558-B9E6-093F153988C2
JUFO ID	wds:Q15751154-77776C80-B7B4-44D3-80F8-8B7F6A6FD409
ERA Journal ID	979
Danish Bibliometri...h Indicator level	1
Danish Bibliometri...tor (BFI) SNO/CNO	4055
JUFO ID	57553
NLM Unique ID	wds:Q15751154-1246104D-5F17-4C92-9B19-E00DC101C691
ACNP journal ID	wds:Q15751154-2561FFB5-0F13-4125-ADD2-72529FF51D5A wds:Q15751154-87EC5581-69F5-481C-AED0-2D7328554841
HAL journal ID	wds:Q15751154-C06F9126-9C40-4D4B-929E-F89A776DBFB0
NLM Unique ID	0422676
ACNP journal ID	2010 2108434
HAL journal ID	5383
instance of	wds:Q15751154-41FF73E3-3A57-4D4C-99F2-DD0816E2C143
instance of	scientific journal
Publons journals/conferences ID	wds:Q15751154-4B840639-38C0-4D59-B584-3E053273397A
Publons journals/conferences ID	4698
publisher	wds:Q15751154-3320AEDA-D7C3-4972-A8A8-3ECB03FDF414
publisher	Institute of Electrical and Electronics Engineers
skos:altLabel	I E E E Transactions on Instrumentation and Measurement (da)
OpenAlex ID	wds:Q15751154-34AE657B-1CC7-427E-ADEA-CD18FA8FB1C3
country of origin	wds:Q15751154-82459403-6CA3-4C92-AD38-C07B057C9D8B
official website	wds:Q15751154-7FEEFC54-C564-403C-A1AC-C6C2A8C149DD
OpenAlex ID	V10892749
country of origin	United States of America
official website	http://ieeexplore.ieee.org/servlet/opac?punumber=19
Scopus source ID	wds:Q15751154-06E1FA09-FDD4-4B06-93D3-49A1BFA0B45F
ISSN	wds:Q15751154-36B5E2CD-619F-487F-A15C-E0A5773EB275 wds:Q15751154-66353833-D24C-47FE-AA81-1522DE152F0F
ISSN-L	wds:Q15751154-AE9960CF-B136-47DC-92BE-6CF210A69BED

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